arrow
Return

Deep-Learning-Based Automated Morphology Analysis With Atomic Force Microscopy

delete2024-10-01
delete1
PRE
AI
Y
Yingao Chang
Z
Zhiang Liu
武毅男 cover
武毅男 (Yinan Wu) *
方勇纯 cover
方勇纯 (Yongchun Fang)
DOI:10.1109/TASE.2023.3346887delete
deleteOriginal
deleteOriginal request for help
deleteShare
deleteSave
Abstract

Abstract

En 中文
Morphology analysis based on atomic force microscopy (AFM) imaging contributes to understanding the characteristics of specimens more deeply. The preliminary and crucial step of implementing morphology analysis is to precisely segment the target area from the complex background. In this study, an automated AFM image segmentation strategy based on a well-designed U-shaped neural network is proposed to achieve accurate and robust segmentation for AFM images of different samples, thus realizing morphology analysis in micro-nano scale. Specifically, the centralized information interaction strategy cooperated with a two-path attention module is introduced to realize efficient cross-scale information interaction, which can fundamentally avoid the negative effects induced by spatial interpolation. Besides, the global information flows are adopted to guide the global information extracted by atrous spatial pyramid pooling to each level of the top-down pathway, which ensures that the high-level semantic information is not diluted during the top-down transmission process, thus locating the target area more precisely. Moreover, an AFM image dataset is constructed to train the network, which will be available online for free to facilitate other data-based AFM research. The segmentation results demonstrate that the proposed strategy has better performance on multiple AFM images compared with traditional Otsu method, fully convolutional network and U-Net. The application of the proposed method is carried out to exhibit the effectiveness in automated morphology analysis. Note to Practitioners-Despite the growing demand of AFM-based morphology analysis in many fields, the automated analysis is still lacking limited by accuracy and robustness of AFM image segmentation. Since manual segmentation, sometimes tedious and time-consuming, heavily depends on the personal judgment, it is thus necessary to develop automated segmentation methods. Although traditional automated segmentation algorithms have good performance on certain types of images, they may be difficult to apply in different scenarios, especially for micro-nano images, due to the limited robustness. Therefore, this paper proposes an automated image segmentation algorithm based on an improved U-shaped neural network to achieve accurate morphology analysis for AFM images. The proposed automated morphology analysis workflow will be a practical tool to help reduce human workload and subjective errors, as well as enhancing the accuracy and robustness of the analysis process. In addition, the constructed AFM image dataset can greatly facilitate the research on data-based AFM image analysis of other practitioners. Moreover, practitioners can benefit from our algorithm to improve the accuracy and robustness of image segmentation in other practical applications.
Keywords:
Atomic force microscopy
morphology analysis
image segmentation
deep learning
U-shaped structure

Journal

IEEE Transactions on Automation Science and Engineering cover
IEEE Transactions on Automation Science and Engineering
IF:
6.4
Papers:
5.1K
Citations:
1.6W

Organization

N
nankai university
Scholars:
4.8W
Papers: 3.3W
Citations: 74
Cited Papers

Cited Papers

High-Speed AFM Reveals Molecular Dynamics of Human Influenza A Hemagglutinin and Its Interaction with Exosomes
err2020-07-27
err25
errOAAI
errLim, Keesiang; Kodera, Noriyuki; Wang, Hanbo; Mohamed, Mahmoud Shaaban; Hazawa, Masaharu; Kobayashi, Akiko; Yoshida, Takeshi; Hanayama, Rikinari; Yano, Seiji; Ando, Toshio; Wong, Richard W.
errShare
errSave
Atomic Force Microscopy Detects the Difference in Cancer Cells of Different Neoplastic Aggressiveness via Machine Learning
err2021-05-27
err20
errOAAI
errPrasad, Siona; Rankine, Alex; Prasad, Tarun; Song, Patrick; Dokukin, Maxim E.; Makarova, Nadezda; Backman, Vadim; Sokolov, Igor
errShare
errSave
ICDAR 2021 Competition on On-Line Signature Verification
err2021-09-02
err0
PREAI
errRuben Tolosana; Ruben Vera-Rodriguez; Carlos Gonzalez-Garcia; Julian Fierrez; Santiago Rengifo; Aythami Morales; Javier Ortega-Garcia; Juan Carlos Ruiz-Garcia; Sergio Romero-Tapiador; Jiajia Jiang; Songxuan Lai; Lianwen Jin; Yecheng Zhu; Javier Galbally; Moises Diaz; Miguel Angel Ferrer; Marta Gomez-Barrero; Ilya Hodashinsky; Konstantin Sarin; Artem Slezkin; Marina Bardamova; Mikhail Svetlakov; Mohammad Saleem; Cintia Lia Szücs; Bence Kovari; Falk Pulsmeyer; Mohamad Wehbi; Dario Zanca; Sumaiya Ahmad; Sarthak Mishra; Suraiya Jabin
errShare
errSave
Atomic force microscopy analysis of nanoparticles in non-ideal conditions
err2011-08-30
err106
errOAAI
errKlapetek, Petr; Valtr, Miroslav; Necas, David; Salyk, Ota; Dzik, Petr
errShare
errSave
researcher View more