FPGA-Based High-Speed Gray-Code Phase Shift Profilometry System

doi:10.1109/TIM.2026.3655945

FPGA-Based High-Speed Gray-Code Phase Shift Profilometry System

2026-01-20

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DOI：10.1109/TIM.2026.3655945

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Phase-shifting profilometry (PSP) traditionally relies on multifrequency phase unwrapping, which requires a large number of projection patterns and limits its applicability in high-speed industrial inspection. Furthermore, existing architectures cannot support real-time processing for dynamic 3-D reconstruction at a resolution of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$2432 \times 2048$ </tex-math></inline-formula>. We present an FPGA-based system that overcomes these limitations by employing a fast unwrapping method combined with algorithm-hardware codesign. A hybrid phase-shifting/Gray-code scheme is mapped onto a fully-pipelined datapath that incorporates two key optimizations: 1) logic-oriented phase quantization and additive decomposition that reduce resource utilization by 9.93% and 2) a high-speed buffering fabric that guarantees lossless data flow at 320 MHz. Operating at 64.1 fps, the prototype achieves less than 0.15 mm accuracy under dynamic experiments. The modular architecture scales to arbitrary objects and can be directly instantiated in high-speed structured-light metrology lines.

Keywords:

Field-programmable gate array (FPGA)

gray-code

phase shifting profilometry (PSP)

structured light

FPGA-Based High-Speed Gray-Code Phase Shift Profilometry System

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