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Guest Editorial: T-ED Special Issue on Reliability of Advanced Nodes

delete2026-08-10
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PRE
AI
F
Francesco Maria Puglisi
Z
Zakariae Chbili
DOI:10.1109/ted.2026.3711245delete
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Abstract

Abstract

En

Journal

IEEE Transactions on Electron Devices cover
IEEE Transactions on Electron Devices
IF:
3.2
Papers:
685
Citations:
3.7W

Organization

U
università di modena e reggio emilia
Scholars:
506
Papers: 155
Citations: 0
I
Intel Corporation
Scholars:
2.7K
Papers: 2.0K
Citations: 6
Cited Papers

Cited Papers

Citing Papers

Citing Papers