arrow
Return

Learn to Generate Complementary March Tests

delete2026-06-11
delete0
PRE
AI
R
Ruiqi Zhu
H
Houjun Wang
C
Chongtao Guo
Y
Yindong Xiao
Z
Zhijian Dai
R
Rui Wu
W
Wanyu Yang
G
Geoffrey Ye Li
DOI:10.1109/tvlsi.2026.3699930delete
deleteOriginal
deleteOriginal request for help
deleteShare
deleteSave
Abstract

Abstract

En 中文
March tests require balancing fault coverage (FC) and test length in embedded memory testing. This brief proposes a novel reinforcement-learning (RL)-based framework that learns optimal March tests by exploiting undetected fault statistics. First, we analyze March tests using a scalable state-tuple-based fault analyzer. Then, we formulate March test generation as a problem to maximize expected FC (EFC) under budget limits. By modeling this as a Markov decision process (MDP), we leverage deep Q-learning to find the optimal operation sequences in March tests, with rewards derived from the proposed fault analyzer. Experimental results demonstrate that our framework generates complementary March tests achieving complete residual FC across a broader range of fault models than the existing methods, with generation efficiency significantly improved through fault analysis completing in milliseconds.
Keywords:
March algorithm
memory testing
reinforcement learning (RL)
test escape
test primitive

Journal

I
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IF:
3.1
Papers:
440
Citations:
7.3K

Organization

U
university of electronic science and technology of china
Scholars:
1.3W
Papers: 4.6K
Citations: 4
I
imperial college london
Scholars:
9.4K
Papers: 4.2K
Citations: 0
S
shenzhen university
Scholars:
4.5W
Papers: 3.4W
Citations: 72
researcher View more organizations