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Scanning Compton X-ray microscopy

delete2021-04-13
delete7
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OA
AI
P
Pablo Villanueva‐Perez *
H
Holger Fleckenstein
M
Mauro Prasciolu
K
Kevin T. Murray
M
M. Domaracký
K
Klara Gregorič
M
Mariani, V
L
Luca Gelisio
M
Manuela Kuhn
J
J. Hannappel
O
Oleksandr Yefanov
N
N. G. Ivanov
I
Iosifina Sarrou
D
David Pennicard
J
Julian Becker
M
M. v. Zimmermann
O
Olof Gutowski
A
Ann‐Christin Dippel
H
Henry N. Chapman
S
S. Bajt
DOI:10.1364/OL.421232delete
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Abstract

Abstract

En 中文
X-ray microscopy offers the opportunity to image biological and radiosensitive materials without special sample preparations, bridging optical and electron microscopy capabilities. However, the performance of such microscopes, when imaging radiosensitive samples, is not limited by their intrinsic resolution, but by the radiation damage induced on such samples. Here, we demonstrate a novel, to the best of our knowledge, radio-efficient microscope, scanning Compton X-ray microscopy (SCXM), which uses coherently and incoherently (Compton) scattered photons to minimize the deposited energy per unit of mass fora given imaging signal. We implemented SCXM, using lenses capable of efficiently focusing 60 keV X-ray photons into the sub-micrometer scale, and probe its radio-efficient capabilities. SCXM, when implemented in high-energy diffraction-limited stor-age rings, e.g., European Synchrotron Radiation Facility Extremely Brilliant Source and PETRA W, will open the opportunity to explore the nanoscale of unstained, unsectioned, and undamaged radiosensitive materials. (C) 2021 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
Keywords:
TOMOGRAPHY

Journal

Optics Letters cover
Optics Letters
IF:
3.3
Papers:
4.0W
Citations:
7.6W

Organization

L
lund university
Scholars:
4.1W
Papers: 3.9W
Citations: 54
H
Helmholtz Association
Scholars:
13.2W
Papers: 10.7W
Citations: 145