Not logged inFast and efficient hard X-ray projection imaging below 10 nm resolution
Zhang, Wenhui; Dresselhaus, J. lukas; Fleckenstein, Holger; Prasciolu, Mauro; Zakharova, Margarita; Ivanov, Nikolay; Li, Chufeng; Yefanov, Oleksandr; Li, Tang; Egorov, Dmitry; Aquino, Ivan de Gennaro; Middendorf, Philipp; Hagemann, Johannes; Shi, Shan; Bajt, Sasa; Chapman, Henry N. .png)
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SaveX-ray focusing below 3 nm with aberration-corrected multilayer Laue lensesResselhaus, J. Lukasd; Zakharova, Margarita; Ivanov, Nikolay; Fleckenstein, Holger; Prasciolu, Mauro; Yefanov, Oleksandr; Li, Chufeng; Zhang, Wenhui; Midendorf, Philipp; Egorov, Dmitry; Aquino, Ivan De Gennaro; Chapman, Henry N.; Bajt, Sasa Share Save Robust ptychographic X-ray speckle tracking with multilayer Laue lensesIvanov, Nikolay; Dresselhaus, J. Lukas; Carnis, Jerome; Domaracky, Martin; Fleckenstein, Holger; Li, Chufeng; Li, Tang; Prasciolu, Mauro; Yefanov, Oleksandr; Zhang, Wenhui; Bajt, Sasa; Chapman, Henry N. Share Save Scanning Compton X-ray microscopyVillanueva-Perez, P.; Fleckenstein, H.; Prasciolu, M.; Murray, K. T.; Domaracky, M.; Gregoric, K.; Mariani, V; Gelisio, L.; Kuhn, M.; Hannappel, J.; Yefanov, O.; Ivanov, N.; Sarrou, I; Pennicard, D.; Becker, J.; von Zimmermann, M.; Gutowski, O.; Dippel, A-C; Chapman, H. N.; Bajt, S. Share Save 
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