Three-dimensional Deconvolution for Large-angle Illumination ADF-STEM Depth Sectioning

Taichi Kusumi

doi:10.1093/mam/ozaf048.712

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Three-dimensional Deconvolution for Large-angle Illumination ADF-STEM Depth Sectioning

2025-07-25

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Naoya Shibata (Naoya Shibata)

Masato Okada

DOI：10.1093/mam/ozaf048.712

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Original request for help

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Abstract

Journal

Microscopy and Microanalysis

IF:

Papers:

2.5K

Citations:

6.2K

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the university of tokyo

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5.0K

Papers: 2.3K

Citations: 1

Cited Papers

Single atom visibility in STEM optical depth sectioning

APPLIED PHYSICS LETTERS

IF3.6

2016-10-19

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Ishikawa, Ryo; Pennycook, Stephen J.; Lupini, Andrew R.; Findlay, Scott D.; Shibata, Naoya; Ikuhara, Yuichi

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Three-Dimensional Imaging of a Single Dopant in a Crystal

PHYSICAL REVIEW APPLIED

IF4.4

2020-03-26

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Ishikawa, Ryo; Shibata, Naoya; Taniguchi, Takashi; Ikuhara, Yuichi

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Attainment of 40.5 pm spatial resolution using 300 kV scanning transmission electron microscope equipped with fifth-order aberration corrector

Microscopy

IF0

2017-12-22

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Shigeyuki Morishita; Ryo Ishikawa; Yuji Kohno; Hidetaka Sawada; Naoya Shibata; Yuichi Ikuhara

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Atomic-Resolution Topographic Imaging of Crystal Surfaces

ACS NANO

IF16

2021-05-13

PREAI

Ishikawa, Ryo; Tanaka, Riku; Kawahara, Kazuaki; Shibata, Naoya; Ikuhara, Yuichi

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Vector approximate message passing

2017 IEEE International Symposium on Information Theory (ISIT)

IF0

2017-06-01

OAAI

Sundeep Rangan; Philip Schniter; Alyson K. Fletcher

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Advanced Computing in Electron Microscopy

IF0

2020-01-01

PREAI

Earl J. Kirkland

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