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Three-dimensional Deconvolution for Large-angle Illumination ADF-STEM Depth Sectioning

2025-07-25

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Toshiro Futazuka

Masatoshi Hanai

Kazuaki Kawahara

DOI：10.1093/mam/ozaf048.712

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Abstract

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Journal

Microscopy and Microanalysis

IF:

3

Papers:

1.4K

Citations:

6.2K

Organization

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the university of tokyo

Scholars:

5.0K

Papers: 2.3K

Citations: 1