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Total internal reflection STED microscopy
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DOI：10.1364/OE.19.013351.png)
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Abstract
En 中文
Stimulated emission depletion (STED) microscopy achieves diffraction-unlimited resolution in far-field fluorescence microscopy well below 100 nm. As common for (single-lens) far-field microscopy techniques, the lateral resolution is better than the axial sectioning capabilities. Here we present the first implementation of total internal reflection (TIR) illumination into STED microscopy which limits fluorophore excitation to similar to 70 nm in the vicinity of the cover slip while simultaneously providing similar to 50 nm lateral resolution. We demonstrate the performance of this new microscope technique with fluorescent bead test samples as well as immuno-stained microtubules. Total internal reflection STED microscopy provides superior axial sectioning capabilities with the potential to reduce photo-bleaching and photo-damage in live cell imaging. (C)2011 Optical Society of America
Keywords:
EMISSION DEPLETION MICROSCOPY
FLUORESCENCE MICROSCOPY
STIMULATED-EMISSION
RESOLUTION
NANOSCOPY
BREAKING
BARRIER
LIMIT
CELL
Journal
IF:
3.3
Papers:
6.1W
Citations:
14.3W
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Cited Papers
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