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Ultralow dark current soft X-ray detectors based on lead-free double perovskite Cs2AgBiBr6
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DOI：10.1088/1674-4926/25070009.png)
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Abstract
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Soft X-ray detectors play a vital role in materials science, high-energy physics and medical imaging. Cs2AgBiBr6, a lead-free double perovskite, has gained attention for its excellent optoelectronic properties, stability, and nontoxicity. However, its fast crystallization and requirement for high-temperature annealing (>250 °C) often lead to inferior film quality, limiting its application in flexible devices. This study introduces an alloying strategy that significantly improves the quality of Cs2AgBiBr6 thin films annealed at a reduced temperature of 150 °C. Devices based on the alloyed thin films exhibit an ultra-low dark current of 0.32 nA∙cm−2 and a quantum efficiency of 725%. Furthermore, the first successful integration of Cs2AgBiBr6 with a thin-film transistor backplane demonstrates its superior imaging performance, indicating that Cs2AgBiBr6 is a promising material for next-generation soft X-ray sensors.
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277
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