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Metrology

IF1.5
Papers52
Citations
Journal Papers 52
Publication Date
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Fourier-Transform-Based Metrology for Whispering Gallery Mode Spectra in Soft Photonic Microcavities
deleteMetrology
IF1.5
delete2026-05-17
delete5
PREAI
deleteKouz, Sadok; El Abed, Abdel I.
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A Study on Thin-Film Dispersion Interference Spectral Measurement by Integrating Deep Learning and Physical Model Fitting
deleteMetrology
IF1.5
delete2026-05-15
delete0
PREAI
deleteWu, Tong; Li, Haopeng; Liu, Chenxu; Zhang, Chuan; Wu, Jiahao; Yu, Jingwei; Liu, Jianjun; Zheng, Zepei; Duan, Bosong; Sun, Anyu; Ju, Bingfeng
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Wheelset Wear Condition Evaluation Based on High-Precision Online Measurement of Geometric Parameters
deleteMetrology
IF1.5
delete2026-05-08
delete0
PREAI
deleteLiu, Saisai; He, Qixin; Fu, Wenjie; Han, Qiang; Feng, Qibo
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Algorithm for Calculation of Pitch Diameter of Parallel Thread Gauge
deleteMetrology
IF1.5
delete2026-05-05
delete0
PREAI
deleteSimunovic, Vedran; Barsic, Gorana; Ferdelji, Nenad
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Interferometric Surface Profile Measurement Based on Radial Polarization and Wavelength Variation
deleteMetrology
IF1.5
delete2026-05-04
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PREAI
deleteChu, Yen-Chang; Bi, Wei-En; Chen, Jing-Heng; Chen, Kun-Huang
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High-Frequency Coupled-Resonator CMUT with Stepped Cavity for Enhanced Sensitivity and Bandwidth in Acoustic Emission Detection
deleteMetrology
IF1.5
delete2026-04-28
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PREAI
deleteMohaidat, Sulaiman; Okour, Mohammad; Al Fayad, Mutaz; Alsaleem, Fadi
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Eccentricity Correction Methods for Circular Targets in Perspective Projection
deleteMetrology
IF1.5
delete2026-04-20
delete0
PREAI
deleteLiebold, Frank; Maas, Hans-Gerd
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Moody Revisited: Least-Squares Solutions of the Union Jack Surface Plate Measurement Method
deleteMetrology
IF1.5
delete2026-04-13
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PREAI
deleteHaitjema, Han
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Shrinkage Estimation to Minimize Error in Measurement Estimates and Consensus Values
deleteMetrology
IF1.5
delete2026-04-09
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PREAI
deleteWillink, Robin
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Experimental Study of High-Frequency Current Transformer for Partial Discharge Detection Using Frequency and Impulse Metrics
deleteMetrology
IF1.5
delete2026-04-01
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PREAI
deleteDella Giovanna, Laura; Guastavino, Francesco; Torello, Eugenia
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A Cost-Effective Cylindrical Capacitive Sensor for Liquid Dielectric Characterization from 1 to 30 MHz
deleteMetrology
IF1.5
delete2026-04-01
delete0
PREAI
deleteOo, Thet Pai; Phakaew, Thipamas; Uzair, Muhammad; Akkaraekthalin, Prayoot; Jeamsaksiri, Wutthinan; Chalermwisutkul, Suramate
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Metrological Aspects of Soft Sensors for Estimating the DC-Link Capacitance of Frequency Inverters
deleteMetrology
IF1.5
delete2026-04-01
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PREAI
deleteClaudino, Vinicius S.; Pacheco, Antonio L. S.; Thaler, Gabriel; Flesch, Rodolfo C. C.
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Uncertainty Assessment of S-Parameters in Vector Network Analyzers Under De-Embedding Conditions
deleteMetrology
IF1.5
delete2026-03-11
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PREAI
deleteZhu, Jiangmiao; Wang, Yifan; Fu, Chaoxian; Man, Kaige; Zhao, Kejia
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Modelling Dissemination of Mass with Buoyancy Correction from Volume and Density of Weights
deleteMetrology
IF1.5
delete2026-03-07
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PREAI
deleteZuda, Jaroslav
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Geometrical Prediction of Copper-Coated Solid-Wire Deposition by Wire-Arc Additive Manufacturing Based on Artificial Neural Networks and Support Vector Machines
deleteMetrology
IF1.5
delete2026-03-06
delete0
PREAI
deletePetrov, Miroslav; Lo Sciuto, Grazia; Tongov, Evgeni; Sofronov, Yavor; Todorov, Georgi; Todorov, Todor; Mishev, Valentin; Nikolov, Antonio; Petrov, Krum
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Control-Enhanced Hamiltonian Optimization for Quantum Parameter Estimation in Many-Body Systems
deleteMetrology
IF1.5
delete2026-03-05
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PREAI
deleteTao, Hong
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Evaluating Measurement Uncertainty Using Measurement Models with Arguments Subject to a Constraint
deleteMetrology
IF1.5
delete2026-03-02
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PREAI
deletevan der Veen, Adriaan M. H.; Kok, Gertjan; Folgero, Kjetil
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Closing Editorial: Advancements in Optical Measurement Devices and Technologies
deleteMetrology
IF1.5
delete2026-02-24
delete0
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deleteKumar, Rahul; Norgia, Michele
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Applying Nondestructive Ultrasonic Technique in the Metrological Control of Heat Treatment of AISI 1045 Steels
deleteMetrology
IF1.5
delete2026-02-24
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deleteMartins, Carlos Otavio Damas; Costa Junior, Jose Carlos Bizerra; Biehl, Luciano Volcanoglo; Medeiros, Jorge Luis Braz
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Extending Reflectometry Range: A Zero-Crossing Algorithm for Thick Film Metrology
deleteMetrology
IF1.5
delete2026-02-19
delete0
deleteOAAI
deleteZhou, Zimu; Lopez-Guerra, Enrique A.; Zana, Iulica; Nguyen, Vu; Tran, Nguyen Quoc Huy; Huang, Violet; Zhou, Bojun; Qian, Gary; Kwan, Michael; Wilkens, Peter; Chien, Chester
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