The impact of ion strike time intervals on single event effect in a 28 nm FPGA
Li, Xinyu; Zhang, Hao; Yan, Xiaoyu; Liu, Yuzhu; Yao, Liwen; Gao, Shuai; Chen, Qiyu; Zhao, Peixiong; Zhao, Shiwei; Zhai, Pengfei; Zhang, Lichen; Liu, Jie
Share
Save Impacts of Thermal Annealing on the Diamond Radiation Detectors (Feb, 10.1080/10420150.2026.2626687, 2026)
Zhao, X.; Wang, L.; Xi, S.; Huang, G.; Zhang, Y.; Liu, D.; Wu, K.; Zhou, C.
Share
Save