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IEEE European Test Symposium
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A Data-driven Approach for Fault Detection in the Alternator Unit of Automotive Systems
2022 IEEE EUROPEAN TEST SYMPOSIUM (ETS 2022)
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2022-05-23
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Vijayan, Arunkumar; Tahoori, Mehdi B.; Kintzli, Ewald; Lohmann, Timm; Handl, Juergen Hans
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Characterization and Handling of Low-Cost Micro-Architectural Signatures in MPSoCs
2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)
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