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IEEE Instrumentation and Measurement Technology Conference

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delete2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
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deleteWendt, Thomas M.; Reindl, Leonhard M.
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deleteBicelli, S.; Depari, A.; Flammini, A.; Marioli, D.; Serpelloni, M.; Sisinni, E.; Taroni, A.
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deleteZangl, Hubert; Fuchs, Anton; Bretterklieber, Thomas; Moser, Michael; Holler, Gert
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deleteAlberola, J.; Pelegri, J.; Lajara, R.; Perez, Juan J.
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deleteWeddell, Alex S.; Harris, Nick R.; White, Neil M.
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deleteMukhopadhyay, S. C.; Sen Gupta, G.; Lake, B. J.
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deleteHarnett, C. K.; Courtney, S. M.; Kimmer, C. J.
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deleteDalola, S.; Ferrari, V.; Guizzetti, M.; Marioli, D.; Sardini, E.; Serpelloni, M.; Taroni, A.
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delete2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
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deletePenella, M. T.; Gasulla, M.
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deleteI2MTC: 2009 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3
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deleteI2MTC: 2009 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3
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deleteI2MTC: 2009 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3
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