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IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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Logic State Imaging From FA Techniques for Special Applications to One of the Most Powerful Hardware Security Side-Channel Threats
2020 IEEE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA)
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2020-07-20
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Boit, Christian; Kiyan, Tuba; Krachenfels, Thilo; Seifert, Jean-Pierre
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A Systematic Approach in the Root Cause Analysis of Battery Module Failures
2020 IEEE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA)
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