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Microelectronic Engineering cover

Microelectronic Engineering

IF3.1
Papers168
Citations8106
Journal Papers 152
Publication Date
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LWR-driven hot carrier degradation-induced variability in CMOS devices: mechanisms and mitigation
deleteMicroelectronic Engineering
IF3.1
delete2026-07-06
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PREAI
deleteYaoting Wang; Yongyu Wu; Dawei Gao; Kai Xu; Hai Wang; Zenan Wang; Kai Xu
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Design of a memristive Chen chaotic system featuring hardware-friendly nonlinearity and its fully integrated circuit validation using SMIC 180 nm CMOS process
deleteMicroelectronic Engineering
IF3.1
delete2026-07-03
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PREAI
deleteZhikui Duan; Yuqi Wang; Jiacheng Li; Xinmei Yu; Shaobo He
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Graphene materials and devices for 6G networks: A critical review
deleteMicroelectronic Engineering
IF3.1
delete2026-06-22
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PREAI
deleteA.S. Augustine Fletcher; P. Murugapandiyan; J. Ajayan; Asisa Kumar Panigrahy; S. Bestley Joe; V. Vanitha
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Interface engineering for dual-gated graphene transistors with high-k Bi4Ti3O12 dielectric layer
deleteMicroelectronic Engineering
IF3.1
delete2026-06-18
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PREAI
deleteTian Tian; Hui Xie; Haihua Wang; Jing Wan; Sui-Dong Wang
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Exploring the relationship between doping and Ti-silicidation for advanced FDSOI applications
deleteMicroelectronic Engineering
IF3.1
delete2026-06-11
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deleteMarie Merlin; Théo Cabaret; Helen Grampeix; Nicolas Gauthier; Mario Ghostine; Joel Kanyandekwe; Philippe Rodriguez; Patrice Gergaud
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From dopant diffusion to optical functionality: A computational study of hyperdoped silicon
deleteMicroelectronic Engineering
IF3.1
delete2026-06-08
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deleteAlberto Debernardi
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Overclocking-tolerant and all on-chip CIM processor for energy-efficient edge lightweight AI inference through custom SOT-MRAM and algorithm-circuit synergy
deleteMicroelectronic Engineering
IF3.1
delete2026-05-23
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PREAI
deleteJiang, Xinpeng; Sun, Sifan; Li, Shaoyi; Zhang, Tuo; Yu, Anyang; Liu, Sijia; Li, Haonan; Sun, Chengyuan; Liu, Hongxi; Li, Xuan; Jin, Hui; Cao, Kaihua; Wang, Zhaohao; Zhang, He; Zhao, Weisheng
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Readout scheme in analog computing-in-memory: Review of design principles and recent progress
deleteMicroelectronic Engineering
IF3.1
delete2026-05-23
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PREAI
deleteZhang, Shizeng; Huang, Pingyang; You, Haitao; Wu, Xinyu; Chen, Wei; Zhang, Li; Cui, Qiang
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Soft detrap scheme for suppressing read-after-write-delay in 3D ferroelectric NAND arrays
deleteMicroelectronic Engineering
IF3.1
delete2026-05-23
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PREAI
deleteLee, Kyungmin; Song, Taehyeon; Kim, Giuk; Kang, Myounggon
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Geometry modulated dual-mode memristor via grayscale thermal probe lithography
deleteMicroelectronic Engineering
IF3.1
delete2026-05-21
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PREAI
deleteZishun Li; KangHao Xie; Jiaqi Wang; Li Wang; Junlu Gong; Chengchen Guo; Xiaorui Zheng
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Layered rare-earth oxychloride YOCl as a scalable high-κ van der Waals dielectric
deleteMicroelectronic Engineering
IF3.1
delete2026-05-09
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PREAI
deleteYubo Liu; Jiayi Chen; Rongkang Lin; Xueqian Liang; Wenting Hong; Wei Liu
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PEALD-AlON passivated GaN-on-Si Millimeter-wave MIS-HEMTs with low noise and high linearity
deleteMicroelectronic Engineering
IF3.1
delete2026-04-23
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PREAI
deleteJing Yuan; Binhao Guo; Yixu Yao; Chenrui Zhang; Ying Luo; Lizhao Cen; Ke Wei; Yankui Li; Sen Huang; Xiaojuan Chen
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2 T DRAM characteristics applying a temperature-dependent a-IGZO TFT model
deleteMicroelectronic Engineering
IF3.1
delete2026-04-17
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PREAI
deleteSunghyun Woo; Seongwoo Kim; Myounggon Kang
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Modelling the ON-state gate leakage current in p-GaN gated AlGaN/GaN HEMTs
deleteMicroelectronic Engineering
IF3.1
delete2026-04-08
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deleteS. Milazzo; G. Greco; G. Giorgino; C. Miccoli; S. Mirabella; F. Iucolano; F. Roccaforte
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Reconfigurable ferroelectric GAAFET architectures for advanced logic circuits
deleteMicroelectronic Engineering
IF3.1
delete2026-04-02
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PREAI
deleteChenhao Xu; Zhibin Wang; Shuxin Chen; Wunan Wang; Kaichen Zhu; Fan Wu; Wenwu Li
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A review of nanoimprint lithography for improving the optical performance of solar cells
deleteMicroelectronic Engineering
IF3.1
delete2026-02-25
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deleteEnzo Ribeiro; André Violas; Tomás Lopes; José Fernandes; Jennifer Teixeira; Paulo Fernandes; Pedro Salomé
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Proposal of a compact plasmonic structure for implementing all-optical logic gates in the C-band
deleteMicroelectronic Engineering
IF3.1
delete2026-02-16
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PREAI
deleteCai Yan; Mehdi Afshari-Bavil; Mir Hamid Rezaei
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Dependence of single-pulse avalanche ruggedness in μH inductor circuit on SiC MOSFETs structure
deleteMicroelectronic Engineering
IF3.1
delete2026-02-01
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PREAI
deleteLingling Lai; Zhixin Liu; Yingxin Cui; Fanpeng Zeng; Litian Huang; Shoulai Gong; Kuan Yew Cheong; Jisheng Han
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Variability in HfO2-based memristors under pulse operation
deleteMicroelectronic Engineering
IF3.1
delete2026-01-22
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deleteD. Maldonado; C. Acal; H. Ortiz; F. Navas-Gomez; A. Cantudo; C. Wenger; E. Pérez; J.B. Roldán
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A product qualification vehicle (PQV) for accelerated yield learning and efficient fault isolation in 28 nm HKMG technologies by capturing LDE and BEOL weak patterns
deleteMicroelectronic Engineering
IF3.1
delete2026-01-21
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PREAI
deleteEnjing Cai; Limin Zhou; Qiang Chen; David Wei Zhang; Qingqing Sun; Hao Zhu
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