Journal Papers 254 Related Insights 0
Electronic nature of the surface defect layer in Cu(In,Ga)Se2: Sensitivity analysis of carrier mobility and defect states via Muon-SCAPS study Violas, A. F.; Castelo-Branco, J.; Alberto, H., V; Vilao, R. C.; Gil, J. M.; Oliveira, A.; Teixeira, J. P.; Fernandes, P. A.; Salome, P. M. P. Share Save
Quantum dot-coated graphene/MoS2 barristor for high-responsivity infrared photodetection (vol 86, pg 118, 2026) Shin, Jinsoo; Park, Do-Hyun; Choi, Inchul; Yu, Jaeho; Lee, Gil-Woo; No, You-Shin; Kim, Un Jeong; Chung, Hyun-Jong Share Save
Effect of top electrode on interfacial layer formation and polarization switching kinetics in post-deposition annealed Hf0.5Zr0.5O2 capacitors Bin Park, Yu; Jung, Tae Hyun; Kim, Beomjun; Kim, Jeonglyul; Lee, Jung Kyu; An, Sang Won; Woo, Chang-Su; Kim, Beomjong; Jung, Hyung-Suk; Yoo, Hyobin; Yang, Sang Mo Share Save