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Ultramicroscopy

IF2
Papers113
Citations8168
Journal Papers 113
Publication Date
Navigating the unavoidable: Enhancing the EBSD indexability through adaptation to three hurdles in femtosecond laser ablation
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deleteChaudry, Umer Masood; Douglas, Gareth; Allen, Jack; Abbott, Andy; Trimby, Patrick; Amer, Mohamed; Chen, Bo
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Elastic and inelastic interactions of electrons in transmission electron microscopy
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deleteKwon, Min Chevalier; Abrahams, Jan Pieter
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Ω-type jitter-free static magnetic compressor for sub-50-fs 200-keV electron pulses
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deleteLv, Zhenxia; Li, Lili; Liu, Yuetian; Bai, Qianqian; Zhang, Xue; Ming, Jiarui; Shi, Yunshu; Xue, Yanhua; Zhao, Wei; Tian, Jinshou; Luo, Duan
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Noise estimation and suppression in quantitative EMCD measurements
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deleteMakino, Hitoshi; Rellinghaus, Bernd; Schneider, Sebastian; Lubk, Axel; Pohl, Darius
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Calibration-sample free distortion correction of electron diffraction patterns using deep learning
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deleteFitzpatrick, Matthew R. C.; Blackburn, Arthur M.; Cordoba, Cristina
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An empirical X-ray K-Ratio framework for thickness measurement of 2D Si and SiO2 thin films and SiO2 layer on Si substrate
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deleteJaber, Ahmad M. D. Assa'd; Shaheen, Adel A.; Al-Mazaydeh, Maryam W. N.; Mousa, Marwan S.; Al Dmour, Hmoud; Alsoud, Ammar
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Detective quantum efficiency of the Timepix4 hybrid pixel detector and its application to parallel-beam diffraction
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deleteDing, Zhiyuan; Dimova, Nina; Barnard, Jonathan S.; Crevatin, Giulio; O'Ryan, Liam; Plackett, Richard; Bortoletto, Daniela; Kirkland, Angus I.; Gallagher-Jones, Marcus
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The third-order aberrations of magnetic sector analyzers
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deleteLi, Meishan; Tao, Hongqing; Hu, Hangfeng; Liu, Fu; Kang, Yongfeng
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The Cramér-Rao lower bound for the precision of scan position refinement in momentum-resolved STEM
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deleteJehle, Andreas; Lorenzen, Tizian; Leidl, Max Leo; Mueller-Caspary, Knut
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FIB-induced gallium contamination as a tool to access aluminium crystallographic information from atom probe tomography data
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deleteMottay, William; Ahmadi, Masoud; Nothomb, Nicolas; Vacirca, Davide; Ghidelli, Matteo; Hoummada, Khalid; Simar, Aude; Idrissi, Hosni
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Information in 4D-STEM: Where it is, and How to Use it
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deleteMa, Desheng; Li, Guanxing; Muller, David A.; Zeltmann, Steven E.
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A calculation approach for the virtual source spatial distribution of sub-beams in single-emitter multi-electron-beam systems
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deleteHu, Jintao; Ma, Yihao; Yue, Lei; Hu, Hangfeng; Liu, Fu; Kang, Yongfeng
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Liquid thickness estimation in transmission electron microscopy
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deleteKaas, Lau Morten; Aymerich-Armengol, Raquel; Alsem, Daan Hein; Damsgaard, Christian Danvad; Helveg, Stig; Kibsgaard, Jakob; Vesborg, Peter Christian Kjaergaard
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Composition fluctuations at interfaces in Mg-Al-Ca alloys revealed by quantitative three-dimensional X-ray energy dispersive spectroscopy
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deleteSnelson, Jessica E.; Yuan, Jillian; Collins, Sean M.; MacArthur, Katherine
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Compressive multi-beam scanning transmission electron microscopy
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deleteYasuhara, Akira; Sannomiya, Takumi; Horisaki, Ryoichi
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Deep learning approaches for dislocation segmentation in TEM
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deleteBoughrara, Assya; Viala, Christine; Dupuy, Laurent; Mompiou, Frederic
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