arrow
BackJournal Details
IEEE Journal of the Electron Devices Society cover

IEEE Journal of the Electron Devices Society

IF2.4
Papers34
Citations3111
Journal Papers 34
Publication Date
Simulation Study on the Scalability of Channel-All-Around Reconfigurable Field-Effect Transistors With Gate-Controlled Polarity
delete2026-01-01
delete0
PREAI
deleteHuo, Ran; Ou, Shijun; Wu, Zhehao; Zhang, Han; Lv, Bowen; Shao, Yvyang; Ma, Zichao; Zhang, Min; Chan, Mansun; Zhou, Changjian
deleteShare
deleteSave
Memcapacitor-Based Insect Feeding Behaviour Classification With Reservoir Computing
delete2026-01-01
delete0
PREAI
deletePetrauskas, Lautaro N.; Kumari, R. Anju; Mannsfeld, Stefan C. B.; Boroujeni, Bahman K.; Ellinger, Frank
deleteShare
deleteSave
Measurement and Analysis of Multistate Ferroelectric Transistors in 28 nm CMOS Process
delete2026-01-01
delete0
PREAI
deleteChowdhury, Sayma Nowshin; Mazzoni, Alex L.; Zhang, Xiaohang; Glasmann, Andreu L.; Mulaosmanovic, Halid; Dunkel, Stefan; Beernink, Gunda; Beyer, Sven; Najmaei, Sina; Shah, Sahil
deleteShare
deleteSave
Characterization of FDSOI Technology for Energy-Efficient Cryo-CMOS Circuits
delete2026-01-01
delete0
PREAI
deleteRao, Arpit; Daughton, David R.; Chacko, Benjamin; Chonko, Jason; Kuang, Yukang; Guenther, Sarah; Gupta, Subhanshu
deleteShare
deleteSave
Memory Window Enhancement With Germanium-Incorporated Charge Trap Layer in Flash Memory Device
delete2026-01-01
delete0
PREAI
deleteShin, Geonhee; Park, Youngkeun; Jeong, Jaejoong; Kim, Heetae; Cho, Byung Jin
deleteShare
deleteSave
Development and Evaluation of SiC LDMOS for High-Temperature Applications
delete2026-01-01
delete0
PREAI
deleteLai, Pengyu; Wang, Hui; Mantooth, H. Alan; Chen, Zhong
deleteShare
deleteSave
2xVDD-Tolerant ESD Clamp With Dual Detection and Ultra-Low Leakage
delete2026-01-01
delete0
PREAI
deleteChen, Kuan-Ying; Wu, Shih-Hsin; Chen, Po-Xiao; Lin, Chun-Yu
deleteShare
deleteSave
Dynamic Evolution of Hydrogen in IGZO Transistors for PBTI Improvement by Low-Temperature Atmosphere Annealing
delete2026-01-01
delete0
PREAI
deleteXiang, Liang; Yan, Gangping; Yang, Hong; Yang, Shangbo; Xu, Gaobo; Sun, Mingyang; Wang, Guilei; Yin, Huaxiang; Wang, Xiaolei; Luo, Jun; Wang, Wenwu
deleteShare
deleteSave
Miller-Current Suppressing Technology for False Turn-On Protection of Commercial p-GaN HEMTs
delete2026-01-01
delete0
PREAI
deleteLiu, Ziheng; He, Jiayin; Peng, Hongjie; Gao, Ju; Xia, Wenbo; Ao, Chengkang; Wang, Jinyan; Wang, Maojun; Wei, Jin; Xie, Yong
deleteShare
deleteSave
Evaluation of Interface Traps Within Drift Region in LDMOS Using a Multi-Pulse Test Method
delete2026-01-01
delete0
PREAI
deleteGuo, Qianwen; Cao, Jiawei; Zhou, Ke; Liu, Fang; Zhao, Dongyan; Chen, Yanning; Wu, Bo; Deng, Yongfeng; Gao, Dawei; Ke, Xugang; Li, Junkang; Zhang, Rui
deleteShare
deleteSave
Continuum Modeling of High-Field Transport in Semiconductors
delete2026-01-01
delete0
PREAI
deleteAncona, M. G.; Devore, C. R.; Cooke, S. J.
deleteShare
deleteSave
Overcoming the Mobility-Stability Trade-Off Using an Ultra-Thin Oxide Capping Layer via N2O Plasma Treatment
delete2026-01-01
delete0
PREAI
deleteChen, Yi-Xuan; He, Yi-Xin; Hsieh, Yu-Shan; Liu, Cheng-Kun; Li, Hui-Hsuan; Pao, Po-Heng; Chih, Jia-Hao; Liu, Bo-Heng; Chou, Tsung-Te; Su, Chien-Ying; Lin, Yu-Hsien; Chien, Chao-Hsin
deleteShare
deleteSave
A Cryogenic Ultra-Thin Body SiGeSn Transistor
delete2026-01-01
delete0
PREAI
deleteFuchsberger, Andreas; Knaller, Nikolas; Nazzari, Daniele; Marboeck, Jacqueline; Navarrete, Enrique Prado; Brehm, Moritz; Pacheco-Sanchez, Anibal; Vogl, Lilian; Schweizer, Peter; Weber, Walter M.; Sistani, Masiar
deleteShare
deleteSave
Realization of Pure Boron/Si Diodes Through a Two-Step Low-Temperature Growth in a Home-Built LP CVD System
delete2026-01-01
delete0
PREAI
deleteVu, Thi Thanh Huong; Batenburg, Kevin M.; Aarnink, Antonius A. I.; Wu, Weihua; Kovalgin, Alexey Y.; Gravesteijn, Dirk J.; Hueting, Raymond J. E.
deleteShare
deleteSave
Investigation of PBTS-Induced Degradation Mechanisms in SA TG Coplanar IGZO TFTs Using Low-Frequency Noise Analysis
delete2026-01-01
delete0
PREAI
deleteLee, Hyeon-Woo; Lee, Su-Hyeon; Lee, Dong-Ho; Oh, Chae-Eun; Son, Dong-Hwi; Kim, Chang-Hyeon; Jeong, Chan-Yong; Jang, Jaeman; Ahn, Byung-Du; Bae, Jong-Uk; Song, Sang-Hun; Kwon, Hyuck-In
deleteShare
deleteSave
Reliability of AlScN/GaN HEMTs Under Pulsed Measurements and HTRB Step-Stress Tests: Experimental and TCAD Insights
delete2026-01-01
delete0
PREAI
deleteErcolano, Franco; Balestra, Luigi; Krause, Sebastian; Leone, Stefano; Streicher, Isabel; Waltereit, Patrick; Dammann, Michael; Reggiani, Susanna
deleteShare
deleteSave