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Journal of Electronic Testing-Theory and Applications

IF1.3
Papers31
Citations549
Journal Papers 31
Publication Date
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The Editorial
deleteJournal of Electronic Testing-Theory and Applications
IF1.3
delete2026-04-01
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PREAI
deleteAgrawal, Vishwani D.
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A Dynamic-Centroid-Guided Method for Efficient Multi-Parameter Trimming of Integrated Chips
deleteJournal of Electronic Testing-Theory and Applications
IF1.3
delete2026-03-01
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PREAI
deleteZhan, Wenfa; Zhou, Yangxinzi; Zeng, Xiaoyang; Li, Yan
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Average Relative SNR: New Metric to Evaluate the Attack Performance of Non-Profiled Side-Channel Traces
deleteJournal of Electronic Testing-Theory and Applications
IF1.3
delete2026-02-01
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PREAI
deleteTang, Cheng; Li, Lang
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PN-SCA: A High Generalization and Fast Profiled SCA Based on Prototypical Networks
deleteJournal of Electronic Testing-Theory and Applications
IF1.3
delete2026-02-01
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PREAI
deleteOu, Yu; Wei, Yongzhuang; Ou, Changhai; Pasalic, Enes
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SRAM PUF Preselection Method Based on Neighboring Spatial Majority Voting
deleteJournal of Electronic Testing-Theory and Applications
IF1.3
delete2026-02-01
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PREAI
deleteShi, Tianyao; Chen, Sining; Chen, Haijin
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Impedance Side-Channel Analysis of ASICs: An investigation of measurement factors
deleteJournal of Electronic Testing-Theory and Applications
IF1.3
delete2026-02-01
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deleteOAAI
deleteFadaeinia, Bijan; Tajik, Shahin; Moradi, Amir
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PFSA: Pseudo Fault Sensitization Attack on Logic Locking via Key-invalidation
deleteJournal of Electronic Testing-Theory and Applications
IF1.3
delete2026-01-01
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PREAI
deleteZhang, Lei; Liu, Xuejun; Lei, Dengyun; Liao, Danpeng; Liu, Yuan
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A Robust AES Implementation using FPGA with Enhanced Security Features
deleteJournal of Electronic Testing-Theory and Applications
IF1.3
delete2026-01-01
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PREAI
deleteAzhaganantham, Arulmurugan; Balasubramaniam, Vivek
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Enhancing Digital VLSI Circuit Debugging with Unified Neighbor aware Graph Neural Network Based Automated Error Detection (Nov, 10.1007/s10836-025-06204-3, 2025)
deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-12-01
delete0
PREAI
deleteBhadavath, Kiran Kumar; Sajjan, Vijayakumar; Domala, Narsaiah; Konduru, Ashok Kumar; Jadapalli, Sreedhar; Vemula, Ramadevi
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The Editorial
deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-12-01
delete0
PREAI
deleteAgrawal, Vishwani D.
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Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Edwar J. Patino Nunez, Robert Limas, and Matteo Sonza Reorda, Investigating and Reducing the Architectural Impact of Transient Faults in Special Function Units for GPUs, Journal of Electronic Testing: Theory and Applications, volume 40, number 2, pp. 215-228, April 2024.
deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-11-01
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PREAI
deleteCondia, Josie E. Rodriguez; Guerrero-Balaguera, Juan-David; Nunez, Edwar J. Patino; Limas, Robert; Reorda, Matteo Sonza
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A Metaheuristic and Neural Network-Based Framework for Automated Software Test Oracles Under Limited Test Data Conditions
deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-11-01
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PREAI
deleteArasteh, Bahman; Bulut, Faruk; Ince, Ibrahim Furkan; Sefati, Seyed Salar; Kusetogullari, Huseyin; Kiani, Farzad
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Analysing the Energy and Power Consumption Impact of Selective Forwarding Attacks on 6LoWPANs: A Detailed Evaluation of MRHOF and OF0 Objective Functions
deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-11-01
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PREAI
deleteRajasekar, V. R.
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Enhancing Digital VLSI Circuit Debugging with Unified Neighbor aware Graph Neural Network Based Automated Error Detection
deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-11-01
delete1
PREAI
deleteBhadavath, Kiran Kumar; Sajjan, Vijayakumar; Domala, Narsaiah; Konduru, Ashok Kumar; Sreedhar, Jadapalli; Vemula, Ramadevi
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SD2CI: A Structure-driven Approach for Detecting Silent Data Corruption Instructions
deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-11-01
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PREAI
deleteYang, Na; Jiang, Shuhao; Wang, Yun; Miao, Qing
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PCB Defects: A Unified Survey of Trends, Detection Techniques, and Limitations through Systematic Literature Review (oct, 10.1007/s10836-025-06198-y, 2025)
deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-11-01
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PREAI
deleteAlawandi, Shreevatsa; Mallibhat, Kaushik; Kudachi, Umer; Beedanal, Aishwarya
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Enhanced Moth Flame Optimization Algorithm Entropy-Based Centroid SVM-Based Software Defect Prediction
deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-11-01
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PREAI
deleteSharma, Sanjiv; Bhardwaj, Ankur; Singh, Amar; Singh, Vinay
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A Program-Output Estimator for Software Testing Using Program Analysis and Deep Learning Algorithms
deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-11-01
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PREAI
deleteArasteh, Bahman; Sefati, Seyed Salar; Gunes, Peri; Hosseinzadeh, Vahid; Kiani, Farzad
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PCB Defects: A Unified Survey of Trends, Detection Techniques, and Limitations through Systematic Literature Review
deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-10-01
delete0
PREAI
deleteAlawandi, Shreevatsa; Mallibhat, Kaushik; Kudachi, Umer; Beedanal, Aishwarya
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Beyond Power Side Channels: Impedance as a Cryptographic Threat
deleteJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
IF1.3
delete2025-10-01
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PREAI
deleteAwal, Md Sadik; Gayanath, Buddhipriya; Rahman, Md Tauhidur
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