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Related Papers (2)
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In-Sensor-Memory Computing for Post-Von Neumann Intelligence: A Perspective
errNano-Micro Letters
IF36.3
err2026-04-20
err0
errOAAI
errHongyu Tang; Ninghai Yu; Pengsheng Min; Ruiqian Guo; Guoqi Zhang
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Long-term high-temperature aging mechanism of copper-metallized through-glass vias: a combined nanoindentation test and hybrid Potts-phase field simulation study
errMicrosystems & Nanoengineering
IF9.9
err2026-02-02
err0
errOAAI
errJunwei Chen; Zezhan Li; Bin Yang; Xiao Hu; Wenyu Li; Zichuan Li; Xuyang Yan; Zhoudong Yang; Jiao Liang; Guannan Yang; Chao Gu; Changran Zheng; Chengqiang Cui; Guoqi Zhang; Jiajie Fan
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