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Vsl Dutch Metrology Institute

Scholars128
Papers99
Citations94
Related Papers (99)
Publication Date
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errMetrology
IF1.5
err2026-03-02
err0
PREAI
errvan der Veen, Adriaan M. H.; Kok, Gertjan; Folgero, Kjetil
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errCytometry Part A
IF2.1
err2026-02-01
err0
errOAAI
errKuiper, Martine; Koops, Richard; Nieuwland, Rienk; van Leeuwen, Ton G.; van der Pol, Edwin
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errLighting Research & Technology
IF2.2
err2026-01-01
err0
PREAI
errKuiper, M. W.; Kallberg, S.; Thorseth, A.; Klej, A.; Mantela, V; Madias, E. N.; Reiners, T.; Zuber, R.; Dekker, P. R.
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err13TH INTERNATIONAL GAS ANALYSIS SYMPOSIUM, GAS 2026
IF0
err2026-01-01
err0
errOAAI
errPersijn, Stefan
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err13TH INTERNATIONAL GAS ANALYSIS SYMPOSIUM, GAS 2026
IF0
err2026-01-01
err0
errOAAI
errde Krom, Iris; Schout, Sophie; Meijer, Luuk; Efremov, Evtim; Persijn, Stefan; Nieuwenkamp, Gerard; van der Veen, Adriaan
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err13TH INTERNATIONAL GAS ANALYSIS SYMPOSIUM, GAS 2026
IF0
err2026-01-01
err0
errOAAI
errGugole, Federica; van der Veen, Adriaan M. H.; de Boed, Ewoud J. J.
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errSave
errATMOSPHERIC MEASUREMENT TECHNIQUES
IF3.3
err2025-01-24
err0
errOAAI
errIturrate-Garcia, Maitane; Salameh, Therese; Schlauri, Paul; Baldan, Annarita; Vollmer, Martin K.; Stratigou, Evdokia; Dusanter, Sebastien; Li, Jianrong; Persijn, Stefan; Claude, Anja; Holzinger, Rupert; Sutour, Christophe; Mace, Tatiana; Elshorbany, Yasin; Ackermann, Andreas; Pascale, Celine; Reimann, Stefan
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err2024 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS, CPEM 2024
IF0
err2024-07-08
err0
PREAI
errZucca, M.; Al-Zubaidi-R-Smith, N.; Bartova, L.; van den Brom, H.; Callegaro, L.; Cultrera, A.; Fast, L.; Grandinetti, B.; Hassanzadeh, M.; Mariscotti, A.; Masouras, A.; Musumeci, S.; Nicol, G.; Ouameur, M.; Rietveld, G.
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errMEASUREMENT
IF5.6
err2024-06-01
err2
errOAAI
errBoeckler, H. -b.; de Huu, M.; Maury, R.; Schmelter, S.; Schakel, M. D.; Bueker, O.; Kutin, J.; Bobovnik, G.; Wedler, C.; Trusler, J. P. M.; Thol, M.; Weiss, S.; Guenz, C.; Schumann, D.; Gugole, F.
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errIEEE MICROWAVE MAGAZINE
IF2.6
err2024-01-01
err9
PREAI
errShang, Xiaobang; Ridler, Nick; Stokes, Daniel; Skinner, James; Mubarak, Faisal; Arz, Uwe; Phung, Gia Ngoc; Kuhlmann, Karsten; Kazemipour, Alireza; Hudlicka, Martin; Ziade, Francois
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errIEEE TRANSACTIONS ON POWER ELECTRONICS
IF6.5
err2023-01-01
err23
errOAAI
errWang, Lisheng; Wang, Wenbo; Hueting, Raymond J. E.; Rietveld, Gert; Ferreira, Jan Abraham
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errANALYTICAL CHEMISTRY
IF6.7
err2022-10-27
err4
errOAAI
errCulleton, Lucy P.; di Meane, Elena Amico; Ward, Michael K. M.; Ferracci, Valerio; Persijn, Stefan; Holmqvist, Albin; Arrhenius, Karine; Murugan, Arul; Brewer, Paul J.
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errMEASUREMENT
IF5.6
err2022-01-01
err12
errOAAI
errKlauenberg, Katy; Martens, Steffen; Bosnjakovic, Alen; Cox, Maurice G.; van der Veen, Adriaan M. H.; Elster, Clemens
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errSave
errIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
IF5.9
err2022-01-01
err3
errOAAI
errLodetti, Stefano; Ritzmann, Deborah; Davis, Peter; Wright, Paul; van den Brom, Helko; Marais, Zander; ten Have, Bas
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errSave
errATMOSPHERIC MEASUREMENT TECHNIQUES
IF3.3
err2021-03-25
err10
errOAAI
errde Krom, Iris; Bavius, Wijnand; Ziel, Ruben; McGhee, Elizabeth A.; Brown, Richard J. C.; Zivkovic, Igor; Gacnik, Jan; Fajon, Vesna; Kotnik, Joze; Horvat, Milena; Ent, Hugo
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errPHYSICS IN MEDICINE AND BIOLOGY
IF3.4
err2021-02-26
err47
errOAAI
errde Pooter, Jacco; Billas, Ilias; de Prez, Leon; Duane, Simon; Kapsch, Ralf-Peter; Karger, Christian P.; van Asselen, Bram; Wolthaus, Jochem
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errMEASUREMENT
IF5.6
err2021-02-01
err9
errOAAI
errde Krom, Iris; Bavius, Wijnand; Ziel, Ruben; Efremov, Evtim; van Meer, Davina; van Otterloo, Peter; van Andel, Inge; van Osselen, Deborah; Heemskerk, Maurice; van der Veen, Adriaan M. H.; Dexter, Matthew A.; Corns, Warren T.; Ent, Hugo
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errAICHE JOURNAL
IF4
err2021-01-11
err0
errOAAI
errvon Preetzmann, Nils; Eckmann, Philipp; van Der Veen, Adriaan M. H.; Li, Jianrong; Richter, Markus
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errANALYST
IF3.3
err2021-01-01
err9
errOAAI
errNwaboh, Javis A.; Meuzelaar, Heleen; Liu, Jiawen; Persijn, Stefan; Li, Jianrong; van der Veen, Adriaan M. H.; Chatellier, Nicolas; Papin, Arnaud; Qu, Zhechao; Werhahn, Olav; Ebert, Volker
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errIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
IF5.9
err2021-01-01
err1
errOAAI
errYe, Gu; Zhao, Wei; Rietveld, Gert
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errSave