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Semiconductor R&D Center

Scholars54
Papers18
Citations0
Related Papers (14)
Publication Date
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Influence of Gate Dielectric and Channel Scaling on the Low-Frequency Noise Characteristics of InGaZnO Field-Effect Transistors
errACS Applied Electronic Materials
IF4.7
err2026-02-04
err0
PREAI
errTaegyu Kim; Youngjin Kang; San Nam; Hyunhee Kim; Sangyeon Kim; Je-Jun Lee; Eungseon Yeon; Jung Pyo Hong; Tae-Yon Lee; Do Kyung Hwang; Yong-Hoon Kim
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Keggin-Type Aluminum Polyoxometalate-Mediated Oxidation of Amorphous Carbon for Engineered Electrochemical Interfaces
errCarbon Energy
IF24.2
err2025-11-29
err0
errOAAI
errGanggyu Lee; Dongmin Kang; Sumin Hong; Hongjun Park; Myungju Woo; Woojin Jeong; Giha Lee; Junsang Lee; Sangkyun Kim; Jea-Gun Park; Takamasa Mori; Yehwan Kim; Taeseup Song; Ungyu Paik
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Tin-Oxo Nanocluster Extreme UV Photoresists Equipped with Chemical Features for Atmospheric Stability and High EUV Sensitivity
errAdvanced Functional Materials
IF19
err2025-11-26
err0
PREAI
errYejin Ku; Gayoung Kim; Minseung Kim; Hyungju Ahn; Jin-Kyun Lee; Jiho Kim; Byeong-Gyu Park; Dohyun Moon; Sangsul Lee; Seohyeon Lee; Yu Ha Jang; Byung Jun Jung; Hyunseok Kim; Changhyeon Lee; Su-Mi Hur; Ji Young Park; Chawon Koh; Tsunehiro Nishi; Hyun-Woo Kim
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errSave
High-Mobility IZO Thin-Film Transistors Enabled by Precise Hydrogen Control Using a SiO2–Al2O3 Supercycle via Plasma-Enhanced Atomic Layer Deposition
errACS Applied Materials & Interfaces
IF8.2
err2025-11-25
err0
PREAI
errSunghwan Park; Seong-In Cho; Hwa Young Kim; Sang-Hee Ko Park; Jong Beom Ko
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An efficient multiscale coupling method for simulations of reactor-scale chemical vapor deposition with microstructural features
errAdvances in Engineering Software
IF5.7
err2025-10-30
err0
PREAI
errTaegeun Kim; Hyoungsoo Ko; Jaewon Jang; Sejin Kim; Sunyoung Park; Jae Myung Choe; Young-gu Kim; Dae Sin Kim; Sangseung Lee; Donghyun You
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Anderson’s negative-U chemistry in amorphous silicon nitride: A complex system approach
errScience Advances
IF12.5
err2025-10-24
err0
PREAI
errWoon Ih Choi; Bokyeom Kim; Uihui Kwon; Yong-Hee Cho; Won-Joon Son; Hawoong Jeong; Richard Dronskowski; Dae Sin Kim
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Atomic-scale analysis of long-term degraded zeolite 13X
errJournal of the American Ceramic Society
IF3.8
err2025-10-15
err0
PREAI
errChang-Gi Lee; Won-Hyoung Lee; Boryung Yoo; Sungho Lee; Jae-Pyoung Ahn; Ayman A. El-Zoka; Se-Ho Kim
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Field-Induced Structural Dynamics of Polarization Switching in HfxZr1-xO2 Thin Films
errAdvanced Materials
IF26.8
err2025-09-25
err0
PREAI
errSangjun Lee; Sunghyun Kim; Seong Yong Park; Donghyun Kim; Su Yong Lee; Daseul Ham; Hyun Hwi Lee; Dongjin Yun; Seontae Park; Soohwan Sul; Seungjin Kang; Geonu Kim; Duk-Hyun Choe; Jooho Lee; Beomseok Kim; Jinseong Heo; Hyung-Suk Jung; Hanjin Lim; Wonsik Choi; Jeong-Gyu Song
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Crack-Free Transfer of Wafer-Scale Freestanding Single-Crystalline Nanomembranes Enabled by Elastically Graded Polymer
errAdvanced Materials
IF26.8
err2025-09-12
err0
PREAI
errJi-Yun Moon; Sanggeun Bae; Jeehoon Ryu; Seung-Il Kim; Sangmoon Han; Justin S. Kim; Jonggyu Choi; Seungsoo Kim; Joo-Hong Lee; Seung-Gu Choi; Ting-Ran Liu; Soyeong Ahn; Jihyung Seo; Jun-Hui Choi; Hyung Jun Kwun; Yu-Tsun Shao; Hyeon-Don Kim; Jin-Hong Park; Jin-Wook Lee; Ji-Won Park; Jae-Hyun Lee; Jong-Hyun Ahn; Sang-Hoon Bae
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Middle Interlayer Engineered Ferroelectric NAND Flash Overcoming Reliability and Stability Bottlenecks for Next-Generation High-Density Storage Systems
errAdvanced Science
IF14.1
err2025-08-23
err0
errOAAI
errGiuk Kim; Sangho Lee; Hyojun Choi; Yangjin Jung; Woongjin Kim; Sanghyun Park; Kwangyou Seo; Kwangsoo Kim; Wanki Kim; Daewon Ha; Mincheol Shin; Jinho Ahn; Sanghun Jeon
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Initial Growth Mechanism and Microstructural Evolution of Sub-10 nm Hydrogenated Amorphous Silicon Films
errACS Applied Materials & Interfaces
IF0
err2025-08-19
err0
PREAI
errJin Young Lee; Jeong-Ho An; Seo Woo Sim; Do Hoe Kim; Yongrae Kim; Yun-Tak Han; Seung Min Park; Si Hyeong Lee; Ki Joon Seong; Soong Ju Oh; Junghan Lee; Hee-eun Song; Joon-Ho Oh; Ka-Hyun Kim
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Deriving optimal atomic layer deposition process conditions using machine learning
errJournal of Industrial Information Integration
IF11.6
err2025-05-28
err0
PREAI
errJangwon Seo; Hyo-Seok Hwang; Sunyoung Park; Seungmin Lee; Dae Sin Kim; Sun-Taek Lim; Junhee Seok
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Growth of Highly-Ordered-Crystalline Indium-Gallium-Oxide Thin-Film via Plasma-Enhanced ALD for High Performance Top-Gate Field-Effect Transistors
errSMALL METHODS
IF9.1
err2024-12-30
err0
PREAI
errMin Jae Kim; Seon Woong Bang; Jae Seok Hur; Seong Hun Yoon; Cheol Hee Choi; Sang Won Chung; Jeong Eun Oh; Yena Kim; Bang Ju Park; Jeonga Lee; Hoichang Yang; Daewon Ha; Min Hee Cho; Jae Kyeong Jeong
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Identifying the Chemical Structure of Indium–Gallium–Zinc Oxide Thin Films with Oxygen Vacancy Variation
errACS Applied Electronic Materials
IF4.7
err
err0
PREAI
errJong-Cheol Lee; Jinheon Choi; Tackhwi Lee; Minsik Kim; Seongmin Ahn; Junghan Lee; Sungho Lee; Jihyun Kho; Yongsoon Choi; Kwangmin Park; Cheol Seong Hwang
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errSave