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SaveReview on the Reliability Mechanisms of SiC Power MOSFETs: A Comparison Between Planar-Gate and Trench-Gate Structures
Wei, Jiaxing; Wei, Zhaoxiang; Fu, Hao; Cao, Junhou; Wu, Tuanzhuang; Sun, Jiameng; Zhu, Xudong; Li, Sheng; Zhang, Long; Liu, Siyang; Sun, Weifeng
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SaveInfluence of Different Device Structures on the Degradation for Trench-Gate SiC MOSFETs: Taking Avalanche Stress as an Example
Wei, Zhaoxiang; Fu, Hao; Yan, Xiaowen; Li, Sheng; Zhang, Long; Wei, Jiaxing; Liu, Siyang; Sun, Weifeng; Wu, Weili; Bai, Song
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