arrow
Back
Z

Zhaoxiang Wei

Beihang University

7H-index
22Paper Count
206Citation Count
Published Papers 3
Publication Date
Review on the Reliability Mechanisms of SiC Power MOSFETs: A Comparison Between Planar-Gate and Trench-Gate Structures
err2023-07-01
err26
PREAI
errWei, Jiaxing; Wei, Zhaoxiang; Fu, Hao; Cao, Junhou; Wu, Tuanzhuang; Sun, Jiameng; Zhu, Xudong; Li, Sheng; Zhang, Long; Liu, Siyang; Sun, Weifeng
errShare
errSave
Influence of Different Device Structures on the Degradation for Trench-Gate SiC MOSFETs: Taking Avalanche Stress as an Example
err2022-01-08
err5
errOAAI
errWei, Zhaoxiang; Fu, Hao; Yan, Xiaowen; Li, Sheng; Zhang, Long; Wei, Jiaxing; Liu, Siyang; Sun, Weifeng; Wu, Weili; Bai, Song
errShare
errSave