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Claudia Fleischmann

imec

18H-index
118Paper Count
959Citation Count
Published Papers 30
Publication Date
Detection and Modulation of Gap States at the Grain Boundaries of Monolayer WS2
err2026-02-05
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PREAI
errFateme Yekefalah; Albert Minj; Ankit Nalin Mehta; Thomas Nuytten; Pawan Kumar; Claudia Fleischmann; Ingrid De Wolf
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A Statistical Approach for Evaluating the Spatial Distribution and Local Atomic Environment of Dopants Using Atom Probe Tomography
err2025-12-01
err0
PREAI
errLin, Jhao-Rong; Morris, Richard J. H.; Scheerder, Jeroen E.; Hikavyy, Andriy; Porret, Clement; Vantomme, Andre; Fleischmann, Claudia
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The Impact of NiO Interlayers and Annealing on Pt/Co for SOT-MRAM
err2025-07-22
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PREAI
errMichelle Wijshoff; Robert Carpenter; Giacomo Talmelli; Sébastien Couet; Jeroen E. Scheerder; Rikkie Joris; Margriet J. Van Bael; Claudia Fleischmann; Kristiaan Temst
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Soft X-ray chemically sensitive ptychographic imaging of 3D nano-objects
err2024-11-18
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errOAAI
errKrasnov, Vitaly; Makhotkin, Igor; Scheerder, Jeroen e.; Loetgering, Lars; Soltwisch, Victor; van der Heide, Paul a. w.; Fleischmann, Claudia
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Raman spectroscopy capabilities for advanced semiconductor technology devices
err2024-07-31
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PREAI
errNuytten, Thomas; Bogdanowicz, Janusz; Sergeant, Stefanie; Fleischmann, Claudia
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Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography
err2024-07-10
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PREAI
errUedono, Akira; Fleischmann, Claudia; Soulie, Jean-Philippe; Ayyad, Mustafa; Scheerder, Jeroen E.; Adelmann, Christoph; Uzuhashi, Jun; Ohkubo, Tadakatsu; Michishio, Koji; Oshima, Nagayasu; Ishibashi, Shoji
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Automated calibration of model-driven reconstructions in atom probe tomography
err2022-07-01
err7
errOAAI
errFletcher, Charles; Moody, Michael P.; Fleischmann, Claudia; Dialameh, Masoud; Porret, Clement; Geiser, Brian; Haley, Daniel
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Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures
errSMALL
IF12.1
err2021-11-25
err14
errOAAI
errHoenicke, Philipp; Kayser, Yves; Nikolaev, Konstantin, V; Soltwisch, Victor; Scheerder, Jeroen E.; Fleischmann, Claudia; Siefke, Thomas; Andrle, Anna; Gwalt, Grzegorz; Siewert, Frank; Davis, Jeffrey; Huth, Martin; Veloso, Anabela; Loo, Roger; Skroblin, Dieter; Steinert, Michael; Undisz, Andreas; Rettenmayr, Markus; Beckhoff, Burkhard
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Grain-boundary segregation of magnesium in doped cuprous oxide and impact on electrical transport properties (vol 11, 7788, 2021)
err2021-08-25
err0
errOAAI
errResende, Joao; Nguyen, Van-Son; Fleischmann, Claudia; Bottiglieri, Lorenzo; Brochen, Stephane; Vandervorst, Wilfried; Favre, Wilfried; Jimenez, Carmen; Deschanvres, Jean-Luc; Nguyen, Ngoc Duy
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Grain-boundary segregation of magnesium in doped cuprous oxide and impact on electrical transport properties
err2021-04-08
err7
errOAAI
errResende, Joao; Van-Son Nguyen; Fleischmann, Claudia; Bottiglieri, Lorenzo; Brochen, Stephane; Vandervorst, Wilfried; Favre, Wilfried; Jimenez, Carmen; Deschanvres, Jean-Luc; Ngoc Duy Nguyen
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Bipolar device fabrication using a scanning tunnelling microscope
err2020-07-27
err31
PREAI
errSkeren, Tomas; Koester, Sigrun A.; Douhard, Bastien; Fleischmann, Claudia; Fuhrer, Andreas
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A Correlative ToF-SIMS/SPM Methodology for Probing 3D Devices
err2020-07-15
err11
errOAAI
errSpampinato, Valentina; Dialameh, Masoud; Franquet, Alexis; Fleischmann, Claudia; Conard, Thierry; van der Heide, Paul; Vandervorst, Wilfried
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Nanoscale Localization of an Atom Probe Tip through Electric Field Mapping
err2019-12-16
err1
errOAAI
errde Beeck, Jonathan Op; Fleischmann, C.; Vandervorst, W.; Paredis, K.
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Amorphous Gadolinium Aluminate as a Dielectric and Sulfur for Indium Phosphide Passivation
err2019-10-25
err9
PREAI
errvan Dorp, Dennis H.; Nyns, Laura; Cuypers, Daniel; Ivanov, Tsvetan; Brizzi, Simone; Tallarida, Massimo; Fleischmann, Claudia; Hoenicke, Philipp; Mueller, Matthias; Richard, Olivier; Schmeisser, Dieter; De Gendt, Stefan; Lin, Dennis H. C.; Adelmann, Christoph
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Inorganic material profiling using Arn+ cluster: Can we achieve high quality profiles?
err2018-06-01
err10
errOAAI
errConard, T.; Fleischmann, C.; Havelund, R.; Franquet, A.; Poleunis, C.; Delcorte, A.; Vandervorst, W.
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Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives
err2018-04-01
err20
PREAI
errBarnes, J. P.; Grenier, A.; Mouton, I.; Barraud, S.; Audoit, G.; Bogdanowicz, J.; Fleischmann, C.; Melkonyan, D.; Vandervorst, W.; Duguay, S.; Rolland, N.; Vurpillot, F.; Blavette, D.
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Dopant, composition and carrier profiling for 3D structures
err2017-05-01
err39
PREAI
errVandervorst, W.; Fleischmann, C.; Bogdanowicz, J.; Franquet, A.; Celano, U.; Paredis, K.; Budrevich, A.
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Understanding Physico-Chemical Aspects in the Depth Profiling of Polymer:Fullerene Layers
err2016-12-01
err8
errOAAI
errSurana, Supriya; Conard, Thierry; Fleischmann, Claudia; Tait, Jeffrey G.; Bastos, Joao P.; Voroshazi, Eszter; Havelund, Rasmus; Turbiez, Mathieu; Louette, Pierre; Felten, Alexandre; Poleunis, Claude; Delcorte, Arnaud; Vandervorst, Wilfried
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Sacrificial Self-Assembled Monolayers for the Passivation of GaAs (100) Surfaces and Interfaces
err2016-08-05
err30
PREAI
errCuypers, Daniel; Fleischmann, Claudia; van Dorp, Dennis H.; Brizzi, Simone; Tallarida, Massimo; Mueller, Matthias; Hoenicke, Philipp; Billen, Arne; Chintala, Ravi; Conard, Thierry; Schmeisser, Dieter; Vandervorst, Wilfried; Van Elshocht, Sven; Armini, Silvia; De Gendt, Stefan; Adelmann, Christoph
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Insights into the nanoscale lateral and vertical phase separation in organic bulk heterojunctions via scanning probe microscopy
err2016-01-01
err7
PREAI
errChintala, R.; Tait, J. G.; Eyben, P.; Voroshazi, E.; Surana, S.; Fleischmann, C.; Conard, T.; Vandervorst, W.
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