F. Bijkerk - Publications, H-index & Citations

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F. Bijkerk

university of twente

34H-index

290Paper Count

4.5KCitation Count

Published Papers 79

Publication Date

In situ ellipsometry study of atomic hydrogen etching of extreme ultraviolet induced carbon layers (vol 258, pg 7, 2011)

APPLIED SURFACE SCIENCE

IF6.9

2023-05-01

OAAI

Chen, Juequan; Louis, Eric; Harmsen, Rob; Tsarfati, Tim; Wormeester, Herbert; van Kampen, Maarten; van Schaik, Willem; van de Kruijs, Robbert; Bijkerk, Fred

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Influence of the Template Layer on the Structure and Ferroelectric Properties of PbZr0.52Ti0.48O3 Films

ACS OMEGA

IF4.3

2022-06-17

OAAI

Lucke, Philip; Nematollahi, Mohammadreza; Bayraktar, Muharrem; Yakshin, Andrey E.; ten Elshof, Johan E.; Bijkerk, Fred

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Relation between composition and fracture strength in off-stoichiometric metal silicide free-standing membranes

INTERMETALLICS

IF4.8

2022-05-01

OAAI

Shafikov, A.; van de Kruijs, R. W. E.; Benschop, J. P. H.; Schurink, B.; van den Beld, W. T. E.; Houweling, Z. S.; Kooi, B. J.; Ahmadi, M.; de Graaf, S.; Bijkerk, F.

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Length Oxidation kinetics of transition metals exposed to molecular and atomic oxygen

MATERIALIA

IF2.9

2021-12-01

OAAI

Boas, Cristiane R. Stilhano Vilas; Sturm, Jacobus M.; van den Beld, Wesley T. E.; Bijkerk, Fred

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Hydrogen etch resistance of aluminium oxide passivated graphitic layers

JOURNAL OF PHYSICS D-APPLIED PHYSICS

IF3.2

2021-09-23

OAAI

Kizir, Seda; van den Beld, Wesley T. E.; Verbakel, Jort D.; Pushkarev, Roman; Houweling, ZSilvester; van de Kruijs, Robbert W. E.; Benschop, Jos P. H.; Bijkerk, Fred

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Bifunctional catalytic effect of Mo2C/oxide interface on multi-layer graphene growth

SCIENTIFIC REPORTS

IF3.9

2021-07-28

OAAI

Kizir, Seda; van den Beld, Wesley T. E.; Schurink, Bart; van de Kruijs, Robbert W. E.; Benschop, Jos P. H.; Bijkerk, Fred

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Nb Texture Evolution and Interdiffusion in Nb/Si-Layered Systems

ACS APPLIED MATERIALS & INTERFACES

IF8.2

2021-06-24

OAAI

Chandrasekaran, Anirudhan; van de Kruijs, Robbert W. E.; Sturm, Jacobus M.; Bijkerk, Fred

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Room temperature oxygen exchange and diffusion in nanometer-thick ZrO2 and MoO3 films

APPLIED SURFACE SCIENCE

IF6.9

2021-06-01

OAAI

Boas, C. R. Stilhano Vilas; Sturm, J. M.; Milov, I; Phadke, P.; Bijkerk, F.

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Planar refractive lenses made of SiC for high intensity nanofocusing

OPTICS EXPRESS

IF3.3

2021-04-23

OAAI

Lyubomirskiy, Mikhail; Schurink, Bart; Makhotkin, Igor A.; Brueckner, Dennis; Wittwer, Felix; Kahnt, Maik; Seyrich, Martin; Seiboth, Frank; Bijkerk, Fred; Schroer, Christian G.

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Strengthening ultrathin Si3N4 membranes by compressive surface stress

SENSORS AND ACTUATORS A-PHYSICAL

IF4.9

2021-01-01

OAAI

Shafikov, A.; Schurink, B.; van de Kruijs, R. W. E.; Benschop, J.; van den Beld, W. T. E.; Houweling, Z. S.; Bijkerk, F.

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Two-level ablation and damage morphology of Ru films under femtosecond extreme UV irradiation

APPLIED SURFACE SCIENCE

IF6.9

2020-10-01

OAAI

Milov, I; Zhakhovsky, V; Ilnitsky, D.; Migdal, K.; Khokhlov, V; Petrov, Yu; Inogamov, N.; Lipp, V; Medvedev, N.; Ziaja, B.; Medvedev, V; Makhotkin, I. A.; Louis, E.; Bijkerk, F.

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Hysteresis, Loss and Nonlinearity in Epitaxial PbZr0.55Ti0.45O3Films: A Polarization Rotation Model

ADVANCED FUNCTIONAL MATERIALS

IF19

2020-09-23

OAAI

Lucke, Philip; Bayraktar, Muharrem; Birkholzer, Yorick A.; Nematollahi, Mohammadreza; Yakshin, Andrey; Rijnders, Guus; Bijkerk, Fred; Houwman, Evert P.

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Near-threshold, steady state interaction of oxygen ions with transition metals: Sputtering and radiation enhanced diffusion

APPLIED SURFACE SCIENCE

IF6.9

2020-07-01

OAAI

Phadke, Parikshit; Boas, Cristiane R. Stilhano Vilas; Sturm, Jacobus M.; van de Kruijs, Robbert W. E.; Bijkerk, Fred

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Comparative H diffusion measurement through metal and non-metal nano-layers using optical sensing

JOURNAL OF PHYSICS D-APPLIED PHYSICS

IF3.2

2020-07-01

OAAI

Soroka, O.; Sturm, J. M.; Lee, C. J.; Bijkerk, F.

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Hydrogen diffusion through Ru thin films

INTERNATIONAL JOURNAL OF HYDROGEN ENERGY

IF8.3

2020-05-01

OAAI

Soroka, O.; Sturm, J. M.; Lee, C. J.; Schreuders, H.; Dam, B.; Bijkerk, F.

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Sputtering and nitridation of transition metal surfaces under low energy, steady state nitrogen ion bombardment

APPLIED SURFACE SCIENCE

IF6.9

2020-03-01

OAAI

Phadke, Parikshit; Sturm, Jacobus M.; van de Kruijs, Robbert W. E.; Bijkerk, Fred

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Etching processes of transferred and non-transferred multi-layer graphene in the presence of extreme UV, H2O and H2

APPLIED SURFACE SCIENCE

IF6.9

2020-02-01

OAAI

Mund, B. K.; Sturm, J. M.; van den Beld, W. T. E.; Lee, C. J.; Bijkerk, F.

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Reflective aperiodic multilayer filters for metrology at XUV sources

OPTICS EXPRESS

IF3.3

2020-01-24

OAAI

Barreaux, J. L. P.; Kozhevnikov, I., V; Bastiaens, H. M. J.; Bijkerk, F.; Boller, K-J

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APPLIED SURFACE SCIENCE

IF6.9

2020-01-01

OAAI

Milov, I; Lipp, V; Ilnitsky, D.; Medvedev, N.; Migdal, K.; Zhakhovsky, V; Khokhlov, V; Petrov, Yu; Inogamov, N.; Semin, S.; Kimel, A.; Ziaja, B.; Makhotkin, I. A.; Louis, E.; Bijkerk, F.

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Nanoscale Transition Metal Thin Films: Growth Characteristics and Scaling Law for Interlayer Formation

ACS APPLIED MATERIALS & INTERFACES

IF8.2

2019-11-15

OAAI

Chandrasekaran, Anirudhan; van de Kruijs, Robbert W. E.; Sturm, Jacobus M.; Zameshin, Andrey A.; Bijkerk, Fred

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Research Directions