Patrick Hoyer - Publications, H-index & Citations

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Patrick Hoyer

fraunhofer gesellschaft

19H-index

42Paper Count

3.6KCitation Count

Published Papers 12

Publication Date

Influence of structure geometry on THz emission from Black Silicon surfaces fabricated by reactive ion etching

OPTICS EXPRESS

IF3.3

2017-03-14

OAAI

Blumroder, Ulrike; Zilk, Matthias; Hempel, Hannes; Hoyer, Patrick; Pertsch, Thomas; Eichberger, Rainer; Unold, Thomas; Nolte, Stefan

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Breaking the diffraction limit of light-sheet fluorescence microscopy by RESOLFT

PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA

IF9.1

2016-03-16

OAAI

Hoyer, Patrick; de Medeiros, Gustavo; Balazs, Balint; Norlin, Nils; Besir, Christina; Hanne, Janina; Kraeusslich, Hans-Georg; Engelhardt, Johann; Sahl, Steffen J.; Hell, Stefan W.; Hufnagel, Lars

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STED nanoscopy with fluorescent quantum dots

NATURE COMMUNICATIONS

IF15.7

2015-05-18

181

OAAI

Hanne, Janina; Falk, Henning J.; Goerlitz, Frederik; Hoyer, Patrick; Engelhardt, Johann; Sahl, Steffen J.; Hell, Stefan W.

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From Membrane to Skin: Aqueous Permeation Control Through Light-Responsive Amphiphilic Polymer Co-Networks

ADVANCED FUNCTIONAL MATERIALS

IF19

2014-05-30

PREAI

Schoeller, Katrin; Kuepfer, Sabrina; Baumann, Lukas; Hoyer, Patrick M.; de Courten, Damien; Rossi, Rene M.; Vetushka, Aliaksei; Wolf, Martin; Bruns, Nico; Scherer, Lukas J.

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A STED Microscope Designed for Routine Biomedical Applications

PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER

IF9.3

2014-01-01

OAAI

Goerlitz, Frederik; Hoyer, Patrick; Falk, Henning J.; Kastrup, Lars; Engelhardt, Johann; Hell, Stefan W.

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Induced terahertz emission as a probe for semiconductor devices

APPLIED PHYSICS LETTERS

IF3.6

2011-12-02