arrow
Back
L

Lutz Kirste

fraunhofer gesellschaft

36H-index
287Paper Count
4.6KCitation Count
Published Papers 65
Publication Date
Strain-driven amorphization in Al1-xYxN thin films and lattice-engineering stabilization illustrated by In1-xYxN
err2026-05-14
err0
PREAI
errAfshar, N.; Wolff, N.; Horich, F.; Stranak, P.; Kirste, L.; Kienle, L.; Dadgar, A.; Ambacher, O.
errShare
errSave
Aluminum gallium nitride grown by halide vapor phase epitaxy: growth on misoriented gallium nitride substrates
err2026-03-31
err0
PREAI
errArianna Jaroszynska; Petro Sadovy; Lutz Kirste; Karol Pozyczka; Robert Kucharski; Michal Bockowski; Tomasz Sochacki
errShare
errSave
GaSb-based 2062 nm single-frequency VECSEL with 3.2 W output power
err2026-03-23
err0
errOAAI
errSteffen Adler; Peter Holl; Elke Diwo-Emmer; Lutz Kirste; Marcel Rattunde
errShare
errSave
Diffusion of oxygen in aluminum nitride
err2026-03-14
err0
PREAI
errTroger-Neuhaus, Jan; Schulz, Tobias; Hartmann, Carsten; Remmele, Thilo; Hagedorn, Sylvia; Kirste, Lutz; Hagenhoff, Birgit; Bracht, Hartmut
errShare
errSave
Investigation of Ti/Al/Ni/Au ohmic contacts for AlScN/GaN HEMTs
err2026-03-07
err0
PREAI
errStreicher, Isabel; Milazzo, Simone; Stranak, Patrik; Kirste, Lutz; Duarte, Teresa; Di Franco, Salvatore; Votadoro, Valerio; Leone, Stefano; Greco, Giuseppe; Roccaforte, Fabrizio
errShare
errSave
Chemical Vapor Deposition of Nitrides by Carbon-Free Brominated Precursors
err2026-02-24
err0
errOAAI
errLeone, Stefano; Duarte, Teresa; Menner, Hanspeter; Richter, Jannik; Kirste, Lutz; Maegdefessel, Sven; Hoffmann, Felix; So, Byeongchan; Quay, Ruediger
errShare
errSave
On germanium doping of gallium nitride: Ion implantation vs in-situ doping during growth
err2026-02-19
err0
PREAI
errKacper Sierakowski; Leszek Konczewicz; Lutz Kirste; Karol Kawka; Pawel Kempisty; Krzysztof Gołyga; Auditee Majumder Momo; Robert Czernecki; Patrik Straňák; Marcin Turek; Tomasz Sochacki; Ramón Collazo; Zlatko Sitar; Michał Boćkowski
errShare
errSave
Performance enhancement of AlGaN/GaN-based high electron mobility transistors with sputtered AlScN gate dielectric
err2026-02-14
err1
errOAAI
errYassine, A.; Driad, R.; Nair, A.; Ott, P.; Kirste, L.; Stranak, P.; Czap, H.; Mikulla, M.; Yassine, M.; Ambacher, O.
errShare
errSave
Stress management of large size (001) and (111) diamond wafers for quantum-optical applications
err2026-01-23
err0
errOAAI
errJan Engels; Jürgen Weippert; Jan Kustermann; Sven Mägdefessel; Niklas Mathes; Jan Jeske; Lutz Kirste; Peter Knittel; Patricia Klar; Tobias Fehrenbach; Christoph Wild; Vadim Lebedev
errShare
errSave
Enhancing NV concentration in delta-doped diamond via low-pressure high-temperature annealing
err2026-01-16
err0
errOAAI
errPhilip Schätzle; Sven Mägdefessel; Leon Büttner; Patrik Straňák; Aurelién Commans; Lutz Kirste; Rebekka Eberle; Volker Cimalla; Peter Knittel
errShare
errSave
AlScN/GaN Multichannel Heterostructures Grown by Metal–Organic Chemical Vapor Deposition
err2025-10-20
err0
errOAAI
errTeresa Duarte; Isabel Streicher; Patrik Straňák; Lutz Kirste; Mario Prescher; Niklas Wolff; Susanne Beuer; Lorenz Kienle; Rüdiger Quay; Stefano Leone
errShare
errSave
Wafer Scale N-Doped Diamond (111) with Mainly Nitrogen Spin Bath Limited Nitrogen Vacancy Coherence Times from Heteroepitexial Growth
err2025-10-01
err0
errOAAI
errWeippert, Jurgen; Engels, Jan; Kustermann, Jan; Fehrenbach, Tobias; Wild, Christoph; Klar, Patricia; Stranak, Patrik; Prescher, Mario; Kirste, Lutz; Magdefessel, Sven; Knittel, Peter; Lebedev, Vadim
errShare
errSave
Thermal annealing effects on the electrical and structural properties of Mo Schottky contacts to n-type 4H-SiC
err2025-06-19
err0
errOAAI
errM. Vivona; I. Streicher; L. Kirste; A.M. Mio; G. Nicotra; P. Fiorenza; F. Giannazzo; F. Roccaforte
errShare
errSave
Development of Semi-Insulating gallium nitride layers on native substrates by magnesium ion implantation and Ultra-High-Pressure annealing
err2025-06-04
err0
PREAI
errSochacki, Tomasz; Kirste, Lutz; Sierakowski, Kacper; Jaroszynska, Arianna; Jakiela, Rafal; Fijalkowski, Michal; Zajzc, Marcin; Koziorowska, Julita Smalc; Lachowski, Artur; Turek, Marcin; Stranak, Patrik; Sumida, Kensuke; Bockowski, Michal
errShare
errSave
Electrical properties of SiN y /Al1-x Sc x N/GaN-based metal-insulator-semiconductor structures
err2025-05-15
err0
errOAAI
errYassine, A.; Yassine, M.; Streicher, I.; Driad, R.; Kirste, L.; Stranak, P.; Doering, P.; Leone, S.; Ambacher, O.
errShare
errSave
Bragg diffraction imaging characterization of crystal defects in GaN (0001) substrates: Comparison of the growth method and the seed approach
err2025-05-08
err0
PREAI
errLutz Kirste; Thu Nhi Tran-Caliste; Tomasz Sochacki; Jan L. Weyher; Patrik Straňák; Robert Kucharski; Karolina Grabianska; José Baruchel; Michal Bockowski
errShare
errSave
Oxygen Doping in Ferroelectric Wurtzite-type Al0.73Sc0.27N: Improved Leakage and Polarity Control
err2025-03-18
err0
errOAAI
errIslam, MR; Wolff, N; Schönweger, G; Kreutzer, TN; Brown, M; Gremmel, M; Ollanescu-Orendi, ES; Stranák, P; Kirste, L; Brennecka, GL; Fichtner, S; Kienle, L
errShare
errSave
Structural and electrical properties of fiber textured and epitaxial molybdenum thin films prepared by magnetron sputter epitaxy
err2025-01-02
err0
errOAAI
errSundarapandian, Balasubramanian; Raghuwanshi, Mohit; Stranak, Patrik; Yu, Yuan; Lyu, Haiyan; Prescher, Mario; Kirste, Lutz; Ambacher, Oliver
errShare
errSave
Sputtered aluminum nitride waveguides for the telecommunication spectrum with less than 0.16 dB/cm propagation loss
err2024-12-09
err0
errOAAI
errSingh, Radhakant; Raghuwanshi, Mohit; Sundarapandian, Balasubramanian; Thomas, Rijil; Kirste, Lutz; Suckow, Stephan; Lemme, Max c.
errShare
errSave
Two-dimensional electron gases in AlYN/GaN heterostructures grown by metal-organic chemical vapor deposition
err2024-05-03
err1
errOAAI
errStreicher, Isabel; Stranak, Patrik; Kirste, Lutz; Prescher, Mario; Mueller, Stefan; Leone, Stefano
errShare
errSave