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Saad, Sehmi

faculte des sciences de tunis (fst)

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1Paper Count
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Published Papers 1
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Reliability Analysis of the LEON3 Memory Subsystem Under Single-Event Upsets: Cache, AHB Interface, and Memory Controller Vulnerability
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IF2.9
err2026-03-03
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PREAI
errKchaou, Afef; Saad, Sehmi; Garrab, Hatem
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Garrab, Hatem
H-index: 0 · Papers: 1
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Kchaou, Afef
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