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John P. Reifenberg

Intel Corporation

14H-index
27Paper Count
2.5KCitation Count
Published Papers 2
Publication Date
Phase Change Memory
err2010-12-01
err1.7K
PREAI
errWong, H. -S. Philip; Raoux, Simone; Kim, SangBum; Liang, Jiale; Reifenberg, John P.; Rajendran, Bipin; Asheghi, Mehdi; Goodson, Kenneth E.
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Thickness and stoichiometry dependence of the thermal conductivity of GeSbTe films
err2007-09-11
err129
PREAI
errReifenberg, John P.; Panzer, Matthew A.; Kim, SangBum; Gibby, Aaron M.; Zhang, Yuan; Wong, Simon; Wong, H.-S. Philip; Pop, Eric; Goodson, Kenneth E.
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