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C

Chao-Jung Chang

National Yang Ming Chiao Tung University

1H-index
5Paper Count
3Citation Count
Published Papers 1
Publication Date
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Increasing detectability in semiconductor foundry by multivariate statistical process control
errTOTAL QUALITY MANAGEMENT & BUSINESS EXCELLENCE
IF4.8
err2008-05-01
err1
PREAI
errYang, Chyan; Chang, Chao-Jung; Niu, Han-Jen; Wu, Hsueh-Chang
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Co-authors
Cooperation Journals
C
Chyan Yang
H-index: 29 · Papers: 171
H
Han‐Jen Niu
H-index: 10 · Papers: 30
H
Hsueh-Chang Wu
H-index: 2 · Papers: 3
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