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Hsueh-Chang Wu

National Yang Ming Chiao Tung University

2H-index
3Paper Count
6Citation Count
Published Papers 1
Publication Date
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Increasing detectability in semiconductor foundry by multivariate statistical process control
errTOTAL QUALITY MANAGEMENT & BUSINESS EXCELLENCE
IF4.8
err2008-05-01
err1
PREAI
errYang, Chyan; Chang, Chao-Jung; Niu, Han-Jen; Wu, Hsueh-Chang
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Co-authors
Cooperation Journals
C
Chyan Yang
H-index: 29 · Papers: 171
H
Han‐Jen Niu
H-index: 10 · Papers: 30
C
Chao-Jung Chang
H-index: 1 · Papers: 5
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