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Seonghun Jang

ajou university

0H-index
1Paper Count
0Citation Count
Published Papers 1
Publication Date
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An Error Correction Code-Based Self-Test for Buffer-Die in High-Bandwidth Memory
errIEEE Transactions on Circuits and Systems I-Regular Papers
IF5.2
err2026-09-11
err0
PREAI
errSeonghun Jang; Jongsoo Yim; Hayoung Lee
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H
Hayoung Lee
H-index: 6 · Papers: 16
J
Jongsoo Yim
H-index: 0 · Papers: 1
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