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S

Satoshi Fukumoto

tokyo metropolitan university

11H-index
118Paper Count
439Citation Count
Published Papers 3
Publication Date
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Self-Training-Based Wafer Map Defect Pattern Labeling for Classification Accuracy Improvement
errInternational Journal of Reliability Quality and Safety Engineering
IF0.9
err2026-02-01
err0
PREAI
errKurokawa, Masaru; Nagamura, Yoshikazu; Arai, Masayuki; Fukumoto, Satoshi
errShare
errSave
Secure kNN for Distributed Cloud Environment Using Fully Homomorphic Encryption
errIEEE Transactions on Cloud Computing
IF5
err2025-04-01
err0
PREAI
errYuuya Fukuchi; Sota Hashimoto; Kazuya Sakai; Satoshi Fukumoto; Min-Te Sun; Wei-Shinn Ku
errShare
errSave
Response-Time Analysis for Controller Area Networks With Randomly Occurring Messages
errIEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY
IF7.1
err2020-04-01
err11
PREAI
errSato, Ryohei; Fukumoto, Satoshi
errShare
errSave

Research Directions

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Co-authors
Cooperation Journals
W
Wei‐Shinn Ku
H-index: 31 · Papers: 229
M
Min-Te Sun
H-index: 22 · Papers: 151
M
Masayuki Arai
H-index: 16 · Papers: 580
K
Kazuya Sakai
H-index: 15 · Papers: 164
Y
Yoshikazu Nagamura
H-index: 4 · Papers: 22
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