logo
CanyamAI summaries for academic research
language
MobileMobile
  • Phone FeatureWeChat Mini Program
EnglishEnglish
noticeNotice
BlogBlog
delete
arrow
Back
Y

Yoshikazu Nagamura

tokyo metropolitan university

4H-index
22Paper Count
55Citation Count
Published Papers 1
Publication Date
logo
Self-Training-Based Wafer Map Defect Pattern Labeling for Classification Accuracy Improvement
errInternational Journal of Reliability Quality and Safety Engineering
IF0.9
err2026-02-01
err0
PREAI
errKurokawa, Masaru; Nagamura, Yoshikazu; Arai, Masayuki; Fukumoto, Satoshi
errShare
errSave

Research Directions

No research directions
Co-authors
Cooperation Journals
M
Masayuki Arai
H-index: 16 · Papers: 580
S
Satoshi Fukumoto
H-index: 11 · Papers: 118
M
Masaru Kurokawa
H-index: 0 · Papers: 2
All loaded