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Young Shin Han

inha university

0H-index
2Paper Count
0Citation Count
Published Papers 2
Publication Date
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A Serial-Number-Level Cumulative-Risk Framework for Yield Monitoring and Inspection Prioritization in Semiconductor Manufacturing
errElectronics
IF2.6
err2026-04-07
err0
errOAAI
errSeong Min Ryu; Young Shin Han; Jong Sik Lee; Bo Seung Kwon
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A BFS-Based DEVS Simulation Kernel for HDL-Compatible Simulation
errElectronics 2026, Vol. 15, Page 48
IF2.6
err2025-12-24
err0
errOAAI
errBo Seung Kwon; Young Shin Han; Jong Sik Lee
errShare
errSave

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Co-authors
Cooperation Journals
B
Bo Seung Kwon
H-index: 0 · Papers: 2
J
Jong Sik Lee
H-index: 0 · Papers: 2
S
Seong Min Ryu
H-index: 0 · Papers: 1
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