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Robbert Wilhelmus Elisabeth van de Kruijs

university of twente

27H-index
208Paper Count
2.2KCitation Count
Published Papers 42
Publication Date
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Hydrogen Radical Permeation Dynamics through Ultrathin ALD Al2O3 Layers Revealed by In Situ Ellipsometry
errThe Journal of Physical Chemistry C
IF3.2
err2026-06-02
err0
PREAI
errWeihua Wu; Robbert W. E. van de Kruijs; Dirk J. Gravesteijn; Z. Silvester Houweling; Giorgio Colombi; Alexey Y. Kovalgin
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Engineering Work Function to Stabilize Metal Oxides in Reactive Hydrogen
errJOURNAL OF PHYSICAL CHEMISTRY LETTERS
IF4.6
err2025-03-03
err0
errOAAI
errRehman, Abdul; van de Kruijs, Robbert W. E.; van den Beld, Wesley T. E.; Sturm, Jacobus M.; Ackermann, Marcelo
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Relation between electronic structure and emissivity of MoSi2-based thin membranes for radiative cooling
errJOURNAL OF ALLOYS AND COMPOUNDS
IF6.3
err2025-03-01
err0
errOAAI
errBaskakov, Arseniy; van de Kruijs, Robbert; Houweling, Z. Silvester; Colombi, Giorgio; Akhmetov, Fedor; Sturm, Jacobus M.; Ackermann, Marcelo
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Structural pathways for ultrafast melting of optically excited thin polycrystalline Palladium films [Acta Materialia, 276 (2024) 120043]
errACTA MATERIALIA
IF9.3
err2025-01-01
err0
errOAAI
errAntonowicz, Jerzy; Olczak, Adam; Sokolowski-Tinten, Klaus; Zalden, Peter; Milov, Igor; Dziegielewski, Przemyslaw; Bressler, Christian; Chapman, Henry N.; Chojnacki, Michal; Dluzewski, Piotr; Rodriguez-Fernandez, Angel; Fronc, Krzysztof; Gawelda, Wojciech; Georgarakis, Konstantinos; Greer, Alan L.; Jacyna, Iwanna; Kruijs, Robbert W. E. van de; Kaminski, Radoslaw; Khakhulin, Dmitry; Klinger, Dorota; Kosyl, Katarzyna M.; Kubicek, Katharina; Migdal, Kirill P.; Minikayev, Roman; Panagiotopoulos, Nikolaos T.; Sikora, Marcin; Sun, Peihao; Yousef, Hazem; Zajkowska-Pietrzak, Wiktoria; Zhakhovsky, Vasily V.; Sobierajski, Ryszard
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Chemically Stable Group IV-V Transition Metal Carbide Thin Films in Hydrogen Radical Environments
errJOURNAL OF PHYSICAL CHEMISTRY C
IF3.2
err2024-10-22
err0
errOAAI
errRehman, Abdul; van de Kruijs, Robbert W. E.; van den Beld, Wesley T. E.; Sturm, Jacobus M.; Ackermann, Marcelo
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errSave
Structural pathways for ultrafast melting of optically excited thin polycrystalline Palladium films
errACTA MATERIALIA
IF9.3
err2024-09-01
err1
errOAAI
errAntonowicz, Jerzy; Olczak, Adam; Sokolowski-Tinten, Klaus; Zalden, Peter; Milov, Igor; Dziegielewski, Przemyslaw; Bressler, Christian; Chapman, Henry N.; Chojnacki, Micha; Dluzewski, Piotr; Rodriguez-Fernandez, Angel; Fronc, Krzysztof; Lda, Wojciech Gawe; Georgarakis, Konstantinos; Greer, Alan L.; Jacyna, Iwanna; van de Kruijs, Robbert W. E.; Kaminski, Rados law; Khakhulin, Dmitry; Klinger, Dorota; Kosyl, Katarzyna M.; Kubicek, Katharina; Migdal, Kirill P.; Minikayev, Roman; Panagiotopoulos, Nikolaos T.; Sikora, Marcin; Sun, Peihao; Yousef, Hazem; Zajkowska-Pietrzak, Wiktoria; Zhakhovsky, Vasily V.; Sobierajski, Ryszard
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Chemical Interaction of Hydrogen Radicals (H*) with Transition Metal Nitrides
errJOURNAL OF PHYSICAL CHEMISTRY C
IF3.2
err2023-09-06
err7
errOAAI
errRehman, Abdul; van de Kruijs, Robbert W. E.; van den Beld, Wesley T. E.; Sturm, Jacobus M.; Ackermann, Marcelo
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In situ ellipsometry study of atomic hydrogen etching of extreme ultraviolet induced carbon layers (vol 258, pg 7, 2011)
errAPPLIED SURFACE SCIENCE
IF6.9
err2023-05-01
err0
errOAAI
errChen, Juequan; Louis, Eric; Harmsen, Rob; Tsarfati, Tim; Wormeester, Herbert; van Kampen, Maarten; van Schaik, Willem; van de Kruijs, Robbert; Bijkerk, Fred
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Relation between composition and fracture strength in off-stoichiometric metal silicide free-standing membranes
errINTERMETALLICS
IF4.8
err2022-05-01
err3
errOAAI
errShafikov, A.; van de Kruijs, R. W. E.; Benschop, J. P. H.; Schurink, B.; van den Beld, W. T. E.; Houweling, Z. S.; Kooi, B. J.; Ahmadi, M.; de Graaf, S.; Bijkerk, F.
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Hydrogen etch resistance of aluminium oxide passivated graphitic layers
errJOURNAL OF PHYSICS D-APPLIED PHYSICS
IF3.2
err2021-09-23
err2
errOAAI
errKizir, Seda; van den Beld, Wesley T. E.; Verbakel, Jort D.; Pushkarev, Roman; Houweling, ZSilvester; van de Kruijs, Robbert W. E.; Benschop, Jos P. H.; Bijkerk, Fred
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Bifunctional catalytic effect of Mo2C/oxide interface on multi-layer graphene growth
errSCIENTIFIC REPORTS
IF3.9
err2021-07-28
err3
errOAAI
errKizir, Seda; van den Beld, Wesley T. E.; Schurink, Bart; van de Kruijs, Robbert W. E.; Benschop, Jos P. H.; Bijkerk, Fred
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Nb Texture Evolution and Interdiffusion in Nb/Si-Layered Systems
errACS APPLIED MATERIALS & INTERFACES
IF8.2
err2021-06-24
err4
errOAAI
errChandrasekaran, Anirudhan; van de Kruijs, Robbert W. E.; Sturm, Jacobus M.; Bijkerk, Fred
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Strengthening ultrathin Si3N4 membranes by compressive surface stress
errSENSORS AND ACTUATORS A-PHYSICAL
IF4.9
err2021-01-01
err13
errOAAI
errShafikov, A.; Schurink, B.; van de Kruijs, R. W. E.; Benschop, J.; van den Beld, W. T. E.; Houweling, Z. S.; Bijkerk, F.
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Near-threshold, steady state interaction of oxygen ions with transition metals: Sputtering and radiation enhanced diffusion
errAPPLIED SURFACE SCIENCE
IF6.9
err2020-07-01
err7
errOAAI
errPhadke, Parikshit; Boas, Cristiane R. Stilhano Vilas; Sturm, Jacobus M.; van de Kruijs, Robbert W. E.; Bijkerk, Fred
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Sputtering and nitridation of transition metal surfaces under low energy, steady state nitrogen ion bombardment
errAPPLIED SURFACE SCIENCE
IF6.9
err2020-03-01
err18
errOAAI
errPhadke, Parikshit; Sturm, Jacobus M.; van de Kruijs, Robbert W. E.; Bijkerk, Fred
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Nanoscale Transition Metal Thin Films: Growth Characteristics and Scaling Law for Interlayer Formation
errACS APPLIED MATERIALS & INTERFACES
IF8.2
err2019-11-15
err18
errOAAI
errChandrasekaran, Anirudhan; van de Kruijs, Robbert W. E.; Sturm, Jacobus M.; Zameshin, Andrey A.; Bijkerk, Fred
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Control of YH3 formation and stability via hydrogen surface adsorption and desorption
errAPPLIED SURFACE SCIENCE
IF6.9
err2018-10-01
err9
errOAAI
errSoroka, Olena; Sturm, Jacobus M.; van de Kruijs, Robbert W. E.; Lee, Chris J.; Bijkerk, Fred
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Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser
errOPTICS EXPRESS
IF3.3
err2018-07-20
err29
errOAAI
errMilov, Igor; Makhotkin, Igor A.; Sobierajski, Ryszard; Medvedev, Nikita; Lipp, Vladimir; Chalupsky, Jaromir; Sturm, Jacobus M.; Tiedtke, Kai; de Vries, Gosse; Stoermer, Michael; Siewert, Frank; van de Kruijs, Robbert; Louis, Eric; Jacyna, Iwanna; Jurek, Marek; Juha, Libor; Hajkova, Vera; Vozda, Vojtech; Burian, Tomas; Saksl, Karel; Faatz, Bart; Keitel, Barbara; Ploenjes, Elke; Schreiber, Siegfried; Toleikis, Sven; Loch, Rolf; Hermann, Martin; Strobel, Sebastian; Nienhuys, Han-Kwang; Gwalt, Grzegorz; Mey, Tobias; Enkisch, Hartmut; Bijkerk, Fred
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Spectral tailoring of nanoscale EUV and soft x-ray multilayer optics
errAPPLIED PHYSICS REVIEWS
IF11.6
err2017-03-21
err91
errOAAI
errHuang, Qiushi; Medvedev, Viacheslav; van de Kruijs, Robbert; Yakshin, Andrey; Louis, Eric; Bijkerk, Fred
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Narrowband and tunable anomalous transmission filters for spectral monitoring in the extreme ultraviolet wavelength region
errOPTICS EXPRESS
IF3.3
err2017-01-25
err6
errOAAI
errBarreaux, J. L. P.; Kozhevnikov, I. V.; Bayraktar, M.; van de Kruijs, R. W. E.; Bastiaens, H. M. J.; Bijkerk, F.; Boller, K. -J.
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Research Directions

No research directions
Co-authors
Cooperation Journals
H
Henry N. Chapman
H-index: 89 · Papers: 692
A
A.L. Greer
H-index: 71 · Papers: 494
D
David Prendergast
H-index: 66 · Papers: 444
M
Martin Hermann
H-index: 58 · Papers: 500
B
Bart J. Kooi
H-index: 53 · Papers: 392
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