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C

Chang Ouk Kim

Yonsei University

25H-index
97Paper Count
2.4KCitation Count
Published Papers 39
Publication Date
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Classifying mixed-defect from single-defect training in imbalanced wafer maps via diffusion and attention
errExpert Systems with Applications
IF7.5
err2025-10-23
err0
PREAI
errDaeyeol Yang; Jaeyeon Jang; Chang Ouk Kim
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errSave
Global feature identification layer for mixed-type wafer bin map classification
errEXPERT SYSTEMS WITH APPLICATIONS
IF7.5
err2025-05-01
err0
PREAI
errJoo, Jaehyeon; Kim, Chang Ouk
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errSave
Teacher-Explorer-Student Learning: A Novel Learning Method for Open Set Recognition
errIEEE TRANSACTIONS ON NEURAL NETWORKS AND LEARNING SYSTEMS
IF8.9
err2025-01-01
err1
errOAAI
errJang, Jaeyeon; Kim, Chang Ouk
errShare
errSave
SAFE: Unsupervised image feature extraction using self-attention based feature extraction network
errEXPERT SYSTEMS
IF2.3
err2024-03-21
err1
PREAI
errChoi, Yeoung Je; Lee, Gyeong Taek; Kim, Chang Ouk
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errSave
Collective Decision of One-vs-Rest Networks for Open-Set Recognition
errIEEE TRANSACTIONS ON NEURAL NETWORKS AND LEARNING SYSTEMS
IF8.9
err2024-02-01
err19
errOAAI
errJang, Jaeyeon; Kim, Chang Ouk
errShare
errSave
Stepwise Soft Actor-Critic for UAV Autonomous Flight Control
errDRONES
IF4.8
err2023-08-24
err2
errOAAI
errHwang, Ha Jun; Jang, Jaeyeon; Choi, Jongkwan; Bae, Jung Ho; Kim, Sung Ho; Kim, Chang Ouk
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errSave
A test vector selection method based on machine learning for efficient presilicon verification
errEXPERT SYSTEMS WITH APPLICATIONS
IF7.5
err2023-08-01
err0
PREAI
errLim, Hyeong Gu; Jang, Jaeyeon; Ju, Byung Kook; Ko, Jae Woo; Kim, Chang Ouk
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errSave
Discovery of fault-introducing tool groups with a numerical association rule mining method in a printed circuit board production line
errINTERNATIONAL JOURNAL OF PRODUCTION RESEARCH
IF7.3
err2023-07-11
err1
PREAI
errLee, Yeonju; Kim, Youngju; Lee, Bogyeong; Kim, Chang Ouk
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errSave
Modular Reinforcement Learning for Autonomous UAV Flight Control
errDRONES
IF4.8
err2023-06-23
err6
errOAAI
errChoi, Jongkwan; Kim, Hyeon Min; Hwang, Ha Jun; Kim, Yong-Duk; Kim, Chang Ouk
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errSave
Unsupervised novelty pattern classification of shmoo plots for visualizing the test results of integrated circuits
errEXPERT SYSTEMS WITH APPLICATIONS
IF7.5
err2022-09-01
err0
PREAI
errShin, Hyun Soo; Kim, Youngju; Kim, Chang Ouk; Park, Sung Ho
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errSave
Siamese Network-Based Health Representation Learning and Robust Reference-Based Remaining Useful Life Prediction
errIEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS
IF9.9
err2022-08-01
err22
PREAI
errJang, Jaeyeon; Kim, Chang Ouk
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errSave
Unstructured borderline self-organizing map: Learning highly imbalanced, high-dimensional datasets for fault detection
errEXPERT SYSTEMS WITH APPLICATIONS
IF7.5
err2022-02-01
err12
PREAI
errJang, Jaeyeon; Kim, Chang Ouk
errShare
errSave
State-Dependent Parameter Tuning of the Apparent Tardiness Cost Dispatching Rule Using Deep Reinforcement Learning
errIEEE ACCESS
IF3.6
err2022-01-01
err6
errOAAI
errMin, Byungwook; Kim, Chang Ouk
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errSave
A variational autoencoder for a semiconductor fault detection model robust to process drift due to incomplete maintenance
errJOURNAL OF INTELLIGENT MANUFACTURING
IF7.4
err2021-07-15
err14
PREAI
errKim, Youngju; Lee, Hoyeop; Kim, Chang Ouk
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errSave
A run-to-run controller for a chemical mechanical planarization process using least squares generative adversarial networks
errJOURNAL OF INTELLIGENT MANUFACTURING
IF7.4
err2020-08-07
err10
PREAI
errKim, Sinyoung; Jang, Jaeyeon; Kim, Chang Ouk
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errSave
Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels
errJOURNAL OF INTELLIGENT MANUFACTURING
IF7.4
err2020-04-16
err30
PREAI
errPark, Seyoung; Jang, Jaeyeon; Kim, Chang Ouk
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errSave
Autonomous Control of Combat Unmanned Aerial Vehicles to Evade Surface-to-Air Missiles Using Deep Reinforcement Learning
errIEEE ACCESS
IF3.6
err2020-01-01
err24
errOAAI
errLee, Gyeong Taek; Kim, Chang Ouk
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errSave
Adaptive Weapon-to-Target Assignment Model Based on the Real-Time Prediction of Hit Probability
errIEEE ACCESS
IF3.6
err2019-01-01
err15
errOAAI
errJang, Jaeyeon; Yoon, Hyui Geon; Kim, Jeong Cheol; Kim, Chang Ouk
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errSave
Recurrent feature-incorporated convolutional neural network for virtual metrology of the chemical mechanical planarization process
errJOURNAL OF INTELLIGENT MANUFACTURING
IF7.4
err2018-07-17
err47
PREAI
errLee, Ki Bum; Kim, Chang Ouk
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errSave
Automatic inspection of salt-and-pepper defects in OLED panels using image processing and control chart techniques
errJOURNAL OF INTELLIGENT MANUFACTURING
IF7.4
err2017-02-13
err15
PREAI
errKwak, Jueun; Lee, Ki Bum; Jang, Jaeyeon; Chang, Kyong Soo; Kim, Chang Ouk
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errSave

Research Directions

No research directions
Co-authors
Cooperation Journals
H
Hyungjun Kim
H-index: 45 · Papers: 260
M
Min Song
H-index: 35 · Papers: 365
J
Ja Young Choi
H-index: 31 · Papers: 151
S
Sinyoung Kim
H-index: 29 · Papers: 268
J
Jieun Kim
H-index: 29 · Papers: 438
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