arrow
Back
O

Olivier Richard

imec

38H-index
364Paper Count
6.7KCitation Count
Published Papers 50
Publication Date
Seed layer effect on the phase evolution of the La-doped hafnium zirconium oxide with back-end-of-line compatibility
err2025-10-01
err0
PREAI
errDae Seon Kwon; Jasper Bizindavyi; Pradyumna Kumar Parida; Gourab De; Hyun-Cheol Kim; Olivier Richard; Paola Favia; Attilio Belmonte; Annelies Delabie; Laura Nyns; Gouri Sankar Kar; Jan Van Houdt; Mihaela Ioana Popovici
errShare
errSave
Structural transformation for BaBiO3-δ thin films grown on SrTiO3-buffered Si(001) induced by an in-situ molecular beam epitaxy cooldown process
err2025-08-20
err0
errOAAI
errIslam Ahmed; Olivier Richard; Partrick Carolan; Marco Gambin; Luca Ceccon; Moloud Kaviani; Stefan De Gendt; Clement Merckling
errShare
errSave
errShare
errSave
Unveiling strain in future generation transistor technology by Bessel beam electron diffraction method
err2025-06-05
err0
PREAI
errFavia, P.; Eneman, G.; Veloso, A.; Mehta, A. Nalin; Martinez, G. T.; Richard, O.; Hikavyy, A.; Gowda, P. P.; Seidel, F.; Pourtois, G.; De Keersgieter, A.; Grieten, E.
errShare
errSave
errShare
errSave
Amorphous Gadolinium Aluminate as a Dielectric and Sulfur for Indium Phosphide Passivation
err2019-10-25
err9
PREAI
errvan Dorp, Dennis H.; Nyns, Laura; Cuypers, Daniel; Ivanov, Tsvetan; Brizzi, Simone; Tallarida, Massimo; Fleischmann, Claudia; Hoenicke, Philipp; Mueller, Matthias; Richard, Olivier; Schmeisser, Dieter; De Gendt, Stefan; Lin, Dennis H. C.; Adelmann, Christoph
errShare
errSave
Redox Layer Deposition of Thin Films of MnO2 on Nanostructured Substrates from Aqueous Solutions
err2019-06-12
err21
errOAAI
errZankowski, Stanislaw P.; van Hoecke, Laurens; Mattelaer, Felix; de Raedt, Marc; Richard, Olivier; Detavernier, Christophe; Vereecken, Philippe M.
errShare
errSave
Simulation of through-cell vias contacts under non-uniform concentrated light profiles
err2018-12-01
err7
PREAI
errRichard, Olivier; Aimez, Vincent; Ares, Richard; Fafard, Simon; Jaouad, Abdelatif
errShare
errSave
Defect evaluation in strain-relaxed Ge0.947Sn0.053 grown on (001) Si
err2018-11-07
err0
PREAI
errGupta, S.; Shimura, Y.; Richard, O.; Douhard, B.; Simoen, E.; Bender, H.; Nakatsuka, O.; Zaima, S.; Loo, R.; Heyns, M.
errShare
errSave
Voltage-controlled reverse filament growth boosts resistive switching memory
err2018-02-02
err24
PREAI
errBelmonte, Attilio; Celano, Umberto; Chen, Zhe; Radhaskrishnan, Janaki; Redolfi, Augusto; Clima, Sergiu; Richard, Olivier; Bender, Hugo; Kar, Gouri Sankar; Vandervorst, Wilfried; Goux, Ludovic
errShare
errSave
Correlation between surface reconstruction and polytypism in InAs nanowire selective area epitaxy
err2017-12-26
err16
PREAI
errLiu, Ziyang; Merckling, Clement; Rooyackers, Rita; Richard, Olivier; Bender, Hugo; Mols, Yves; Vila, Maria; Rubio-Zuazo, Juan; Castro, German R.; Collaert, Nadine; Thean, Aaron; Vandervorst, Wilfried; Heyns, Marc
errShare
errSave
Simulation of a through cell via contacts architecture for HCPV multi-junction solar cells
err2016-01-01
err18
PREAI
errRichard, Olivier; Jaouad, Abdelatif; Bouzazi, Boussairi; Ares, Richard; Fafard, Simon; Aimez, Vincent
errShare
errSave
Imaging the Three-Dimensional Conductive Channel in Filamentary-Based Oxide Resistive Switching Memory
err2015-11-03
err170
PREAI
errCelano, Umberto; Goux, Ludovic; Degraeve, Robin; Fantini, Andrea; Richard, Olivier; Bender, Hugo; Jurczak, Malgorzata; Vandervorst, Wilfried
errShare
errSave
Transition metal contacts to graphene
err2015-10-15
err36
PREAI
errPolitou, Maria; Asselberghs, Inge; Radu, Iuliana; Conard, Thierry; Richard, Olivier; Lee, Chang Seung; Martens, Koen; Sayan, Safak; Huyghebaert, Cedric; Tokei, Zsolt; De Gendt, Stefan; Heyns, Marc
errShare
errSave
Extracting the effective bandgap of heterojunctions using Esaki diode I-V measurements
err2015-08-17
err6
errOAAI
errSmets, Quentin; Verhulst, Anne S.; El Kazzi, Salim; Verreck, Devin; Richard, Olivier; Bender, Hugo; Collaert, Nadine; Mocuta, Anda; Thean, Aaron; Heyns, Marc M.
errShare
errSave
Epitaxial diamond-hexagonal silicon nano-ribbon growth on (001) silicon
err2015-08-04
err30
errOAAI
errQiu, Y.; Bender, H.; Richard, O.; Kim, M. -S.; Van Besien, E.; Vos, I.; de ten Broeck, M. de Potter; Mocuta, D.; Vandervorst, W.
errShare
errSave
Quantitative Method to Determine Planar Defect Frequency in In As Nanowires by High Resolution X-ray Diffraction
err2015-07-07
err7
PREAI
errLiu, Ziyang; Merckling, Clement; Caymax, Matty; Rooyackers, Rita; Collaert, Nadine; Thean, Aaron; Richard, Olivier; Bender, Hugo; Vandervorst, Wilfried; Heyns, Marc
errShare
errSave
Phase Formation and Morphology of Nickel Silicide Thin Films Synthesized by Catalyzed Chemical Vapor Reaction of Nickel with Silane
err2014-12-22
err15
PREAI
errPeter, Antony Premkumar; Meersschaut, Johan; Richard, Olivier; Moussa, Alain; Steenbergen, Johnny; Schaekers, Marc; Tokei, Zsolt; Van Elshocht, Sven; Adelmann, Christoph
errShare
errSave
Three-Dimensional Observation of the Conductive Filament in Nanoscaled Resistive Memory Devices
err2014-04-10
err303
PREAI
errCelano, Umberto; Goux, Ludovic; Belmonte, Attilio; Opsomer, Karl; Franquet, Alexis; Schulze, Andreas; Detavernier, Christophe; Richard, Olivier; Bender, Hugo; Jurczak, Malgorzata; Vandervorst, Wilfried
errShare
errSave
Ultrathin NiGe Films Prepared via Catalytic Solid-Vapor Reaction of Ni with GeH4
err2013-09-19
err6
PREAI
errPeter, Antony P.; Opsomer, Karl; Adelmann, Christoph; Schaekers, Marc; Meersschaut, Johan; Richard, Olivier; Vaesen, Inge; Moussa, Alain; Franquet, Alexis; Zsolt, Tokei; Van Elshocht, Sven
errShare
errSave