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SaveUnveiling strain in future generation transistor technology by Bessel beam electron diffraction method
Favia, P.; Eneman, G.; Veloso, A.; Mehta, A. Nalin; Martinez, G. T.; Richard, O.; Hikavyy, A.; Gowda, P. P.; Seidel, F.; Pourtois, G.; De Keersgieter, A.; Grieten, E.
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SaveAmorphous Gadolinium Aluminate as a Dielectric and Sulfur for Indium Phosphide Passivation
van Dorp, Dennis H.; Nyns, Laura; Cuypers, Daniel; Ivanov, Tsvetan; Brizzi, Simone; Tallarida, Massimo; Fleischmann, Claudia; Hoenicke, Philipp; Mueller, Matthias; Richard, Olivier; Schmeisser, Dieter; De Gendt, Stefan; Lin, Dennis H. C.; Adelmann, Christoph
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SaveDefect evaluation in strain-relaxed Ge0.947Sn0.053 grown on (001) Si
Gupta, S.; Shimura, Y.; Richard, O.; Douhard, B.; Simoen, E.; Bender, H.; Nakatsuka, O.; Zaima, S.; Loo, R.; Heyns, M.
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SaveVoltage-controlled reverse filament growth boosts resistive switching memory
Belmonte, Attilio; Celano, Umberto; Chen, Zhe; Radhaskrishnan, Janaki; Redolfi, Augusto; Clima, Sergiu; Richard, Olivier; Bender, Hugo; Kar, Gouri Sankar; Vandervorst, Wilfried; Goux, Ludovic
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SaveCorrelation between surface reconstruction and polytypism in InAs nanowire selective area epitaxy
Liu, Ziyang; Merckling, Clement; Rooyackers, Rita; Richard, Olivier; Bender, Hugo; Mols, Yves; Vila, Maria; Rubio-Zuazo, Juan; Castro, German R.; Collaert, Nadine; Thean, Aaron; Vandervorst, Wilfried; Heyns, Marc
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SaveTransition metal contacts to graphene
Politou, Maria; Asselberghs, Inge; Radu, Iuliana; Conard, Thierry; Richard, Olivier; Lee, Chang Seung; Martens, Koen; Sayan, Safak; Huyghebaert, Cedric; Tokei, Zsolt; De Gendt, Stefan; Heyns, Marc
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SaveExtracting the effective bandgap of heterojunctions using Esaki diode I-V measurements
Smets, Quentin; Verhulst, Anne S.; El Kazzi, Salim; Verreck, Devin; Richard, Olivier; Bender, Hugo; Collaert, Nadine; Mocuta, Anda; Thean, Aaron; Heyns, Marc M.
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SaveQuantitative Method to Determine Planar Defect Frequency in In As Nanowires by High Resolution X-ray Diffraction
Liu, Ziyang; Merckling, Clement; Caymax, Matty; Rooyackers, Rita; Collaert, Nadine; Thean, Aaron; Richard, Olivier; Bender, Hugo; Vandervorst, Wilfried; Heyns, Marc
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SaveThree-Dimensional Observation of the Conductive Filament in Nanoscaled Resistive Memory Devices
Celano, Umberto; Goux, Ludovic; Belmonte, Attilio; Opsomer, Karl; Franquet, Alexis; Schulze, Andreas; Detavernier, Christophe; Richard, Olivier; Bender, Hugo; Jurczak, Malgorzata; Vandervorst, Wilfried
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SaveUltrathin NiGe Films Prepared via Catalytic Solid-Vapor Reaction of Ni with GeH4
Peter, Antony P.; Opsomer, Karl; Adelmann, Christoph; Schaekers, Marc; Meersschaut, Johan; Richard, Olivier; Vaesen, Inge; Moussa, Alain; Franquet, Alexis; Zsolt, Tokei; Van Elshocht, Sven
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