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S

Sichkovskyi, V.

Affiliation pending

0H-index
1Paper Count
0Citation Count
Published Papers 1
Publication Date
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High-resolution X-ray diffraction to probe quantum dot asymmetry
errMEASUREMENT
IF5.6
err2023-11-01
err2
errOAAI
errSerafinczuk, J.; Rudno-Rudzinski, W.; Gawelczyk, M.; Podemski, P.; Parzyszek, K.; Piejko, A.; Sichkovskyi, V.; Reithmaier, J. P.; Sek, G.
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Co-authors
Cooperation Journals
J
Johann Peter Reithmaier
H-index: 38 · Papers: 424
G
G. Sęk
H-index: 30 · Papers: 319
J
J. Serafińczuk
H-index: 19 · Papers: 114
P
P. Podemski
H-index: 14 · Papers: 49
W
W. Rudno‐Rudziński
H-index: 11 · Papers: 60
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