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IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems

IF0
论文数3
被引数0
期刊论文 3
发表时间
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Validation Challenges in Recent Trends of Power Management in Microprocessors
delete2020 33RD IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS (DFT)
IF0
delete2020-10-19
delete1
PREAI
deleteReddy, Nagabhushan; Menon, Sankaran; Joshi, Prashant D.
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CORE-VR: A Coherence and Reusability Aware Low Voltage Fault Tolerant Cache in Multicore
delete2019 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS (DFT)
IF0
delete2019-10-01
delete1
PREAI
deleteChoudhury, Avishek; Sikdar, Biplab K.
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Reducing Test Power for Embedded Memories
delete2011 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS (DFT)
IF0
delete2011-10-01
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PREAI
deleteAwad, Ahmed; Abu-Issa, Abdallatif; Hamdioui, Said
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