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A Study on Thin-Film Dispersion Interference Spectral Measurement by Integrating Deep Learning and Physical Model Fitting基于深度学习与物理模型拟合的薄膜分散干涉光谱测量研究
Wu, Tong; Li, Haopeng; Liu, Chenxu; Zhang, Chuan; Wu, Jiahao; Yu, Jingwei; Liu, Jianjun; Zheng, Zepei; Duan, Bosong; Sun, Anyu; Ju, Bingfeng
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收藏 Extending Reflectometry Range: A Zero-Crossing Algorithm for Thick Film Metrology扩展反射测量范围:一种用于厚膜测量的零交叉算法
Zhou, Zimu; Lopez-Guerra, Enrique A.; Zana, Iulica; Nguyen, Vu; Tran, Nguyen Quoc Huy; Huang, Violet; Zhou, Bojun; Qian, Gary; Kwan, Michael; Wilkens, Peter; Chien, Chester
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