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Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization

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论文数2
被引数0
期刊论文 2
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Applications of KPFM-Based Approaches for Surface Potential and Electrochemical Measurements in Liquid
deleteKELVIN PROBE FORCE MICROSCOPY: FROM SINGLE CHARGE DETECTION TO DEVICE CHARACTERIZATION
IF0
delete2018-03-10
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PREAI
deleteCollins, Liam; Weber, Stefan A. L.; Rodriguez, Brian J.
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Nanoscale Transport Imaging of Active Lateral Devices: Static and Frequency Dependent Modes
deleteKELVIN PROBE FORCE MICROSCOPY: FROM SINGLE CHARGE DETECTION TO DEVICE CHARACTERIZATION
IF0
delete2018-03-10
delete3
PREAI
deleteStrelcov, Evgheni; Ahmadi, Mahshid; Kalinin, Sergei V.
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