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Journal of Electronic Testing

IF
论文数21
被引数
期刊论文 20
发表时间
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A 1 ps Resolution Built–Out Self–Test (BOST) Method for GaN Gate Drivers Using Gaussian–Distributed Dither (GDD)基于高斯分布抖动(GDD)的GaN门驱动器1 ps分辨率构建自测试(BOST)方法
deleteJournal of Electronic Testing
IF0
delete2026-06-19
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PREAI
deleteKeno Sato; Masaya Hirakawa; Kenta Suzuki; Haruo Kobayashi
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Using DC Transistor Characterization Measurements for LNA Design at Cryogenic Temperatures利用直流晶体管特性测量进行低温低噪声放大器设计
deleteJournal of Electronic Testing
IF0
delete2026-06-08
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PREAI
deleteGiovani Britton; Salvador Mir; Estelle Lauga-Larroze; Benjamin Dormieu; José Lugo; Joao Azevedo; Sebastien Sadlo; Quentin Berlingard; Mikaël Cassé; Philippe Galy
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GHOST: Graph-based Hardware Ownership Security through TraceabilityGHOST：基于图硬件所有权安全通过可追溯性
deleteJournal of Electronic Testing
IF0
delete2026-06-05
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PREAI
deleteAshwin C.S; Suchismita Roy
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A Low-Delay Power-Efficient 14T SRAM with Word-Line Separation for Radiation-Hardened Aerospace applications低延迟高能效14T SRAM及其字线分离技术用于抗辐射加固航天应用
deleteJournal of Electronic Testing
IF0
delete2026-06-04
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PREAI
deleteShuo Cai; Maoxuan Wei; Zhu Huang; Wei Shuai; Fei Yu
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Study on Analysis and Troubleshooting Methods for Common Faults of a Certain Type of On-board Recorder某型机载记录仪常见故障的分析与故障排除方法研究
deleteJournal of Electronic Testing
IF0
delete2026-06-01
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PREAI
deleteNing Wang; Xiang Fan; Zhenquan Zhou; Lihong Zheng
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Comparative Design and Analysis of RHBD SRAM Cells for Space Applications空间应用中带异或门冗余的静态随机存取存储器单元的对比设计与分析
deleteJournal of Electronic Testing
IF0
delete2026-06-01
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PREAI
deleteJamuna S.; Hannan Ashrafi; Suma M. R.; Srividya L.; Suraj Malagar; T Mohammad Nisar
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ATPG Optimization for Bridging Faults in Incomplete Testing of SoCsATPG优化用于SoCs不完全测试中的桥接故障
deleteJournal of Electronic Testing
IF0
delete2026-06-01
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PREAI
deleteKunwer Mrityunjay Singh; Santosh Biswas; Jatindra Deka
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Extended Multi-Region Hamming-based ECC for Mitigating Clustered Faults in 3D Memories扩展的多区域基于汉明码的ECC用于缓解3D存储器中的簇故障
deleteJournal of Electronic Testing
IF0
delete2026-06-01
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PREAI
deleteAkshith Kannan; Hafsa Ariba; Hitha B M; Jyotsna Padmanaban Kamali; Sunita M S
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An Ultra-Broadband On-Chip DC-Feed Block for Sub-THz Applications in InP Technology基于InP技术的用于亚太赫兹应用的超宽带片上直流馈电块
deleteJournal of Electronic Testing
IF0
delete2026-05-21
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PREAI
deleteYao Li; Yan Gao; Liang Zhao; Yan Sun; Weihua Yu
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Dynamic Meta-Learning with Attentional Prototypes for Few-Shot Wafer Defect Recognition基于注意力原型模型的动态元学习方法在少样本晶圆缺陷识别中的应用
deleteJournal of Electronic Testing
IF0
delete2026-04-06
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PREAI
deleteTianming Ni; Meifang Yu; Xiaofei Chen; Huaguo Liang; Senling Wang; Muyang Cheng; Mu Nie
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New Primitive Polynomials over GF(2) of Degree 661 Through 1200 for In-System Test ApplicationsGF(2)上度数为661至1200的用于系统内测试应用的原始多项式
deleteJournal of Electronic Testing
IF0
delete2026-04-01
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PREAI
deleteGrzegorz Mrugalski; Janusz Rajski; Maciej Trawka; Jerzy Tyszer
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Error Resilient Transformers: A Novel Soft Error Vulnerability Guided Approach to Error Checking and Suppression容错Transformer：一种新型基于软错误脆弱性的错误检测与抑制方法
deleteJournal of Electronic Testing
IF0
delete2026-04-01
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deleteOAAI
deleteKwondo Ma; Chandramouli Amarnath; Jackson Isenberg; Abhijit Chatterjee
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ResNeSt Wafer Map Defect Pattern Recognition Based on the Multi-attention Mechanism and Enhanced Activation Function基于多注意力机制和增强激活函数的ResNeSt晶圆图缺陷模式识别
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delete2026-04-01
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PREAI
deleteShouhong Chen; Lingfeng Han; Cong Wei; Ziren Zhu; Xingna Hou; Ling Guo
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Nonvolatile Flip-Flop Designs with Soft Error Recovery Based on Magnetic Tunnel Junction and CMOS for Aerospace Applications基于磁隧道结和CMOS的具有软错误恢复功能的非易失性触发器设计及其在航天领域的应用
deleteJournal of Electronic Testing
IF0
delete2026-04-01
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PREAI
deleteZhongyu Gao; Huan Liu; Jie Song; Zhiyuan Pei; Wangjin Jiang; Qijun Wang; Xiaoqing Wen
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Optimized QCA-Based SRAM Cell Using a D-latch: Design and Performance Analysis基于QCA的优化SRAM单元设计及性能分析：采用D触发器
deleteJournal of Electronic Testing
IF0
delete2026-03-25
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PREAI
deleteAbhinav Tripathi; G. R. Mishra; Geetika Srivastava; Sachin Singh; Vandana Dubey
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SAF-YOLO: a Semantic-Aware Lightweight Framework for Fine-Grained PCB Defect DetectionSAF-YOLO：一种面向语义的轻量级细粒度PCB缺陷检测框架
deleteJournal of Electronic Testing
IF0
delete2026-03-24
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PREAI
deleteXianjun Du; Jingxiang Wang
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Exploring Differential Evolution Algorithms in Search of Best Test Vector for Digital Circuit Testing探索差分进化算法在数字电路测试中最佳测试向量搜索的应用
deleteJournal of Electronic Testing
IF0
delete2026-03-23
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PREAI
deleteIsha Dubey; Manish Kumar; Priyajit Bhattacharya; Rahul Bhattacharya
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An Efficient Cybersecurity Method to Detect Phishing Attacks Integrating Heuristic-Driven Feature Optimizer and Deep Learning Algorithms基于启发式驱动特征优化器和深度学习算法的钓鱼攻击检测的高效网络安全方法
deleteJournal of Electronic Testing
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delete2026-01-01
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PREAI
deleteShaoju Li; Asgarali Bouyer; Bahman Arasteh
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Advancing Low Power BIST Architecture with GAN-Driven Test Pattern Optimization推进低功耗BIST架构与GAN驱动的测试模式优化
deleteJournal of Electronic Testing
IF0
delete2024-11-13
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PREAI
deleteC. Thangam; R. Manjith
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MATLAB-Open Source Tool Based Framework for Test Generation for Digital Circuits Using Evolutionary Algorithms基于进化算法的数字电路测试生成MATLAB开源工具框架
deleteJournal of Electronic Testing
IF0
delete2023-10-24
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PREAI
deletePriyajit Bhattacharya; Rahul Bhattacharya; Himasree Deka
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