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IEEE International Reliability Physics Symposium and IRPS

IF0
论文数2
被引数0
期刊论文 2
发表时间
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Industrial approach to the chip and package reliability of SiC MOSFETs (Invited)SiC mosfet的芯片和封装可靠性的工业方法 (邀请)
delete2023 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS
IF0
delete2023-03-01
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PREAI
deleteMengotti, Elena; Bianda, Enea; Baumann, David; Schlottig, Gerd; Canales, Francisco
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Estimation of SOH Degradation of Coin Cells Subjected to Accelerated Life Cycling with Randomized Cycling Depths and C-Rates
delete2023 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS
IF0
delete2023-03-01
delete0
PREAI
deleteLall, Pradeep; Soni, Ved; Sethi, Guneet; Yiang, Kok
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