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IEEE European Test Symposium Proceedings

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论文数1
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期刊论文 2
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Low power embedded DRAMs with high quality error correcting capabilities
deleteETS 2005:10TH IEEE EUROPEAN TEST SYMPOSIUM, PROCEEDINGS
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delete2024-09-05
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PREAI
deleteÖhler, P; Hellebrand, S
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Selecting power-optimal SBST routines for on-line processor testing
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PREAI
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