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International Symposium on Quality Electronic Design, Proceedings

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论文数1
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期刊论文 2
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Power reduction in test-per-scan BIST with supply gating and efficient scan partitioning
delete6TH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN, PROCEEDINGS
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delete2024-09-05
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deleteBhunia, S; Mahmoodi, H; Ghosh, D; Roy, K
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TFT-LCD application specific low power SRAM using charge-recycling technique
delete6TH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN, PROCEEDINGS
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PREAI
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