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Unveiling the Roles of Bulk and Interface Defects of a High-K Dielectric TiO2-Based Charge-Trapping Layer in the Device Failure of Non-Volatile Charge-Trapping Memory揭示高介电常数介电材料TiO2基电荷捕获层体缺陷和界面缺陷在非易失性电荷捕获存储器器件失效中的作用
Xia, Zhaoqing; He, Yukai; Lv, Lin; Niu, Huan; Zheng, Zebin; Liu, Xiaoshan; Dong, Wenjing; Wang, Xunying; Wan, Houzhao; Ma, Guokun; Wang, Hao
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收藏 Structural and Antimicrobial Properties of Alginate and Chitosan Films with Silver Nanoparticlesda Rocha Vaz, G.M.; Pinelli, J.J.; Bonatto, C.C.; Silva, L.P. 藻酸盐和壳聚糖薄膜中银纳米粒子的结构与抗菌性能. Surfaces 2026, 9, 25. [Google Scholar] [CrossRef]
Vaz, Gabriela Mendes da Rocha; Pinelli, Juliana Junqueira; Bonatto, Cinthia Caetano; Silva, Luciano Paulino
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