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IEEE Transactions on Device and Materials Reliability

IF2.3
论文数84
被引数2623
期刊论文 84
发表时间
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deleteIEEE Transactions on Device and Materials Reliability
IF2.3
delete2026-03-01
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PREAI
deleteSingh, Dharmendra Kumar; Marothya, Himanshu; Shetty, Arjun; Mondal, Sandip
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deleteIEEE Transactions on Device and Materials Reliability
IF2.3
delete2026-03-01
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deleteQu, Zifeng; Duan, Jiachen; Li, Ang; Zhang, Xuanming; Tian, Hao; Wu, Jingyue; Guo, Qiyi; Zhang, Qiyuan; Jiang, Yizhou; Luo, Ningyu; Zhang, Xiaodong; Yu, Guohao; Long, Chao; Liu, Wen; Wen, Huiqing
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deleteIEEE Transactions on Device and Materials Reliability
IF2.3
delete2026-03-01
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deleteLee, Ee Lynn; Sing Goh, Yi; Haseeb, A. S. M. A.; Hoong Wong, Yew; Faizul Mohd Sabri, Mohd; Yew Low, Boon
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deleteIEEE Transactions on Device and Materials Reliability
IF2.3
delete2026-03-01
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deleteIsmail, Harun; Su, Shun-Feng
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deleteIEEE Transactions on Device and Materials Reliability
IF2.3
delete2026-03-01
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deleteYan, Aibin; Li, Jinpeng; Li, Kun; Wang, Wenhao; Huang, Zhengfeng; Ni, Tianming; Wang, Qijun; Girard, Patrick; Wen, Xiaoqing
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deleteIEEE Transactions on Device and Materials Reliability
IF2.3
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deleteVecchio, Michael A.; Osenbach, John
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deleteIEEE Transactions on Device and Materials Reliability
IF2.3
delete2026-03-01
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deleteWang, Xiao-Lin; Zhao, Han-Lin; Kim, Sung-Jin
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deleteIEEE Transactions on Device and Materials Reliability
IF2.3
delete2026-03-01
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deleteAziza, H.; Xun, H.; Fieback, M.; Taouil, M.; Hamdioui, S.
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deleteIEEE Transactions on Device and Materials Reliability
IF2.3
delete2026-03-01
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deleteDai, Chenghu; Qin, Yongqi; Lv, Jing; Zhang, Beibei; Peng, Chunyu; Li, Xin; Liu, Yu; Wu, Xiulong; Lin, Zhiting
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deleteIEEE Transactions on Device and Materials Reliability
IF2.3
delete2026-03-01
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deleteLi, Kunfang; Feng, Jie; Wen, Lin; Zhang, Wei; Guo, Qi; Li, Yudong
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deleteIEEE Transactions on Device and Materials Reliability
IF2.3
delete2026-03-01
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deleteLing, Wanyi; Ren, Kun; Qi, Dianyu; Wu, Yongyu; Li, Guangji; Zhou, Miao; Xu, Qingshuang; Li, Xuan; Fan, Dertsyr; Chuang, Ichun; Cheng, Tzungwen; Tsai, Chenming; Gao, Dawei
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deleteIEEE Transactions on Device and Materials Reliability
IF2.3
delete2026-03-01
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deleteYi, Bo; Zhang, Gaolei; Wu, Xinyi; Li, Huan; Cheng, Junji; Huang, Haimeng; Kong, Moufu; Yang, Hongqiang
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deleteIEEE Transactions on Device and Materials Reliability
IF2.3
delete2026-03-01
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deleteBaranwal, Kashika; Prakash, Prem; Yadav, Vinod Kumar
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deleteIEEE Transactions on Device and Materials Reliability
IF2.3
delete2026-03-01
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deleteKer, Chieh-Chen; Lin, Chun-Yu; Ker, Ming-Dou; Chiang, Tsung-Yin; Wang, Chun-Chi; Jiang, Ryan
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deleteIEEE Transactions on Device and Materials Reliability
IF2.3
delete2026-03-01
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deleteTakeshita, T.; Abe, Y.
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deleteIEEE Transactions on Device and Materials Reliability
IF2.3
delete2026-03-01
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deleteHu, Minchi; Shen, Lei; Xie, Sisi; Zheng, Xuezhi; Zhang, Jing; Zeng, Hongjie; Wu, Zehao; Cai, Chang
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deleteIEEE Transactions on Device and Materials Reliability
IF2.3
delete2026-03-01
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deleteCheung, Kin P.; Wen, Yu-Xin; Tsui, Bing-Yue
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deleteIEEE Transactions on Device and Materials Reliability
IF2.3
delete2026-03-01
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deleteJeong, Seungjoon; Kim, Myongjin; Lim, Subin; Shin, Huiseong; Shin, Changhwan
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deleteIEEE Transactions on Device and Materials Reliability
IF2.3
delete2026-03-01
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deleteLi, Xue; Chen, Kai; Yin, Weinan; Li, Yunlong
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deleteIEEE Transactions on Device and Materials Reliability
IF2.3
delete2026-03-01
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deleteKumari, Shikha; Singh, Shreesh; Piyush, Kumar; Vigneshwara Raja, P.
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