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期刊详情
U
Ultramicroscopy
IF
2
论文数
113
被引数
8168
相关解读
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期刊论文
113
相关解读
0
期刊论文
113
发表时间
发表时间
IF
被引数
Minimization of spherical aberration for a magnetic lens with the aid of calculus of variations
利用变分法减小磁透镜的球差
Ultramicroscopy
IF
2
2026-07-01
0
PRE
AI
Al-Obaidi, Hassan N.
分享
收藏
Navigating the unavoidable: Enhancing the EBSD indexability through adaptation to three hurdles in femtosecond laser ablation
应对不可避免的问题:通过适应飞秒激光烧蚀中的三大障碍来提升EBSD可索引性
Ultramicroscopy
IF
2
2026-07-01
0
OA
AI
Chaudry, Umer Masood; Douglas, Gareth; Allen, Jack; Abbott, Andy; Trimby, Patrick; Amer, Mohamed; Chen, Bo
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Elastic and inelastic interactions of electrons in transmission electron microscopy
透射电子显微镜中电子的弹性与非弹性相互作用
Ultramicroscopy
IF
2
2026-07-01
1
OA
AI
Kwon, Min Chevalier; Abrahams, Jan Pieter
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Ω-type jitter-free static magnetic compressor for sub-50-fs 200-keV electron pulses
Ω型无抖动静态磁压缩器用于亚50飞秒200千电子伏特电子脉冲
Ultramicroscopy
IF
2
2026-07-01
0
PRE
AI
Lv, Zhenxia; Li, Lili; Liu, Yuetian; Bai, Qianqian; Zhang, Xue; Ming, Jiarui; Shi, Yunshu; Xue, Yanhua; Zhao, Wei; Tian, Jinshou; Luo, Duan
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Noise estimation and suppression in quantitative EMCD measurements
定量EMCD测量中的噪声估计与抑制
Ultramicroscopy
IF
2
2026-07-01
0
OA
AI
Makino, Hitoshi; Rellinghaus, Bernd; Schneider, Sebastian; Lubk, Axel; Pohl, Darius
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Calibration-sample free distortion correction of electron diffraction patterns using deep learning
基于深度学习的无校准样本电子衍射图畸变校正
Ultramicroscopy
IF
2
2026-05-01
1
OA
AI
Fitzpatrick, Matthew R. C.; Blackburn, Arthur M.; Cordoba, Cristina
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Suppression of secondary recoil cascade damage in high-Z/low-Z heterostructures: a mechanism-driven FIB strategy
高Z/低Z异质结构中二次反冲级联损伤的抑制:一种机理驱动的聚焦离子束策略
Ultramicroscopy
IF
2
2026-05-01
0
PRE
AI
Zhang, Zixuan; Wu, Kai; Jin, Chuanhong
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An empirical X-ray K-Ratio framework for thickness measurement of 2D Si and SiO2 thin films and SiO2 layer on Si substrate
一种用于测量二维Si和SiO2薄膜以及Si基板上SiO2层厚度的经验X射线K比率框架
Ultramicroscopy
IF
2
2026-05-01
0
OA
AI
Jaber, Ahmad M. D. Assa'd; Shaheen, Adel A.; Al-Mazaydeh, Maryam W. N.; Mousa, Marwan S.; Al Dmour, Hmoud; Alsoud, Ammar
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Detective quantum efficiency of the Timepix4 hybrid pixel detector and its application to parallel-beam diffraction
Timepix4混合像素探测器的探测量子效率及其在平行束衍射中的应用
Ultramicroscopy
IF
2
2026-05-01
2
PRE
AI
Ding, Zhiyuan; Dimova, Nina; Barnard, Jonathan S.; Crevatin, Giulio; O'Ryan, Liam; Plackett, Richard; Bortoletto, Daniela; Kirkland, Angus I.; Gallagher-Jones, Marcus
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The third-order aberrations of magnetic sector analyzers
磁扇形分析仪的三阶像差
Ultramicroscopy
IF
2
2026-05-01
0
PRE
AI
Li, Meishan; Tao, Hongqing; Hu, Hangfeng; Liu, Fu; Kang, Yongfeng
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收藏
The Cramér-Rao lower bound for the precision of scan position refinement in momentum-resolved STEM
动量分辨扫描透射电子显微镜中扫描位置精修精度的克拉美-罗下界
Ultramicroscopy
IF
2
2026-05-01
0
PRE
AI
Jehle, Andreas; Lorenzen, Tizian; Leidl, Max Leo; Mueller-Caspary, Knut
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A microscope- auxiliary device to profile the setae patterns of earthworm species; a study on Eudrilus eugeniae, Lampito mauritii, Pontoscolex corethrurus, and Perionyx ceylanensis
显微镜辅助装置用于测定蚯蚓物种刚毛模式的表征;对Eudrilus eugeniae、Lampito mauritii、Pontoscolex corethrurus和Perionyx ceylanensis的研究
Ultramicroscopy
IF
2
2026-05-01
0
PRE
AI
Vijayan, Vijithkumar; Sivasubramaniam, Sudhakar
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收藏
FIB-induced gallium contamination as a tool to access aluminium crystallographic information from atom probe tomography data
FIB诱导的镓污染作为从原子探针断层扫描数据中获取铝晶体结构信息的工具
Ultramicroscopy
IF
2
2026-05-01
0
PRE
AI
Mottay, William; Ahmadi, Masoud; Nothomb, Nicolas; Vacirca, Davide; Ghidelli, Matteo; Hoummada, Khalid; Simar, Aude; Idrissi, Hosni
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Information in 4D-STEM: Where it is, and How to Use it
4D-STEM中的信息:其位置及使用方法
Ultramicroscopy
IF
2
2026-05-01
10
OA
AI
Ma, Desheng; Li, Guanxing; Muller, David A.; Zeltmann, Steven E.
分享
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Liquid thickness estimation in transmission electron microscopy
透射电子显微镜中液体厚度的估计
Ultramicroscopy
IF
2
2026-05-01
0
OA
AI
Kaas, Lau Morten; Aymerich-Armengol, Raquel; Alsem, Daan Hein; Damsgaard, Christian Danvad; Helveg, Stig; Kibsgaard, Jakob; Vesborg, Peter Christian Kjaergaard
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A calculation approach for the virtual source spatial distribution of sub-beams in single-emitter multi-electron-beam systems
单发射极多电子束系统中子束虚拟源空间分布的计算方法
Ultramicroscopy
IF
2
2026-05-01
0
PRE
AI
Hu, Jintao; Ma, Yihao; Yue, Lei; Hu, Hangfeng; Liu, Fu; Kang, Yongfeng
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Composition fluctuations at interfaces in Mg-Al-Ca alloys revealed by quantitative three-dimensional X-ray energy dispersive spectroscopy
Mg-Al-Ca合金界面处的组分波动由定量三维X射线能量色散光谱揭示
Ultramicroscopy
IF
2
2026-05-01
0
OA
AI
Snelson, Jessica E.; Yuan, Jillian; Collins, Sean M.; MacArthur, Katherine
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收藏
Compressive multi-beam scanning transmission electron microscopy
压缩多束扫描透射电子显微镜
Ultramicroscopy
IF
2
2026-05-01
0
OA
AI
Yasuhara, Akira; Sannomiya, Takumi; Horisaki, Ryoichi
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Deep learning approaches for dislocation segmentation in TEM
透射电子显微镜中位错分割的深度学习方法
Ultramicroscopy
IF
2
2026-05-01
0
PRE
AI
Boughrara, Assya; Viala, Christine; Dupuy, Laurent; Mompiou, Frederic
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Dose constraints for high-resolution imaging of biological specimens with extreme ultraviolet and soft X-ray radiation
高分辨生物样品成像中极紫外和软X射线辐射的剂量限制
Ultramicroscopy
IF
2
2026-05-01
1
OA
AI
Liu, Chang; Licht, Leona; Rothhardt, Jan
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