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M

Mohsen Raji

Shiraz University

12H指数
89论文数
458被引数
收录论文 12
发表时间
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Pruning Strategies of Vision Transformers: A Specialized Survey视觉变换器的剪枝策略：一项专业综述
errIEEE Open Journal of the Computer Society
IF8.2
err2026-05-21
err0
errOAAI
errSetareh Ahsaei; Mohsen Raji
err分享
err收藏
RAP: A Reliability-aware Pruning Framework for Deep Neural NetworksRAP：一种面向可靠性的深度神经网络剪枝框架
errJournal of Systems Architecture
IF4.1
err2026-05-02
err0
PREAI
errSetareh Ahsaei; Mohsen Raji; Behnam Ghavami
err分享
err收藏
SARG: Software Application Resiliency Prediction Using Graph Neural NetworksSARG：基于图神经网络的软件应用韧性预测
errJournal of Systems and Software
IF4.1
err2025-11-10
err0
PREAI
errMohammad Reza Pirayesh; Mohsen Raji; Mohammad Reza Moosavi
err分享
err收藏
LOST-ViT: A Low Overhead Soft Error Tolerance Framework for Vision Transformers via Model Compression and Selective Bit-Level RedundancyLOST-ViT：一种通过模型压缩和选择性位级冗余实现的低开销软错误容忍框架，用于视觉变压器
errJournal of Systems Architecture
IF4.1
err2025-11-01
err0
PREAI
errSetareh Ahsaei; Mohsen Raji
err分享
err收藏
A Comprehensive Soft Error Resiliency Analysis of Distributed Deep Neural Networks
errCONCURRENCY AND COMPUTATION-PRACTICE & EXPERIENCE
IF1.5
err2025-10-25
err1
PREAI
errAhsaei, Setareh; Raji, Mohsen; Golmankhaneh, Maryam Asadi
err分享
err收藏
Progressive Bitwidth Assignment Approaches for Efficient Capsule Networks Quantization用于高效胶囊网络量化的渐进位宽分配方法
errIEEE ACCESS
IF3.6
err2025-01-01
err0
errOAAI
errRaji, Mohsen; Ahsaei, Amir Ghazizadeh; Soroush, Kimia; Ghavami, Behnam
err分享
err收藏
A Statistical Gate Sizing Method for Timing Yield and Lifetime Reliability Optimization of Integrated Circuits
errIEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING
IF5.4
err2021-04-01
err9
PREAI
errEbrahimipour, S. M.; Ghavami, Behnam; Raji, Mohsen
err分享
err收藏
Lifetime Reliability Improvement of Nano-Scale Digital Circuits Using Dual Threshold Voltage Assignment
errIEEE ACCESS
IF3.6
err2021-01-01
err2
errOAAI
errRaji, Mohsen; Mahmoudi, Reza; Ghavami, Behnam; Keshavarzi, Saeed
err分享
err收藏
Timing Reliability Improvement of Master-Slave Flip-Flops in the Presence of Aging Effects
errIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS
IF5.2
err2020-12-01
err4
PREAI
errJafari, Atousa; Raji, Mohsen; Ghavami, Behnam
err分享
err收藏
Process variation-aware gate sizing with fuzzy geometric programming
errCOMPUTERS & ELECTRICAL ENGINEERING
IF4.9
err2019-09-01
err2
PREAI
errGhavami, Behnam; Raji, Mohsen; Rasaizadi, Ramin; Mashinchi, Mashaallah
err分享
err收藏
Soft Error Reliability Improvement of Digital Circuits by Exploiting a Fast Gate Sizing Scheme
errIEEE ACCESS
IF3.6
err2019-01-01
err13
errOAAI
errRaji, Mohsen; Sabet, M. Amin; Ghavami, Behnam
err分享
err收藏
A Scalable Solution to Soft Error Tolerant Circuit Design Using Partitioning-Based Gate Sizing使用基于分区的门大小调整的软容错电路设计的可扩展解决方案
errIEEE TRANSACTIONS ON RELIABILITY
IF5.7
err2017-03-01
err14
PREAI
errSabet, M. Amin; Ghavami, Behnam; Raji, Mohsen
err分享
err收藏

研究方向

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合作学者
合作期刊
M
M. Mashinchi
H 指数: 21 · 论文数: 117
R
Reza Mahmoudi
H 指数: 17 · 论文数: 184
B
Behnam Ghavami
H 指数: 14 · 论文数: 134
M
Mohammad R. Moosavi
H 指数: 8 · 论文数: 46
S
Saeed Keshavarzi
H 指数: 5 · 论文数: 28
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